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Conference Paper: A novel characterization method of the radiation emission for electromagnetic compatibility
Title | A novel characterization method of the radiation emission for electromagnetic compatibility |
---|---|
Authors | |
Keywords | Characterization methods Dyadic green's functions Electronic device Equivalent source Far field |
Issue Date | 2011 |
Publisher | IEEE. |
Citation | The 2011 IEEE International Symposium on Electromagnetic Compatibility (EMC), Long Beach, CA., 14-19 August 2011. In IEEE EMC Symposium Record, 2011, p. 264-269 How to Cite? |
Abstract | Conventionally the radiation emissions from PCB boards, electronic devices and antennas were characterized through the near field (NF)-far field (FF) transformation to find the equivalent sources. In this paper, a new methodology without NF-FF transformation is presented. Based on the uniqueness theorem, it only employs the measured tangential field over a spherical surface to rigorously characterize the outward radiation emission. The dyadic Green's function for the perfect magnetic conductor (PMC) sphere is derived using spherical wave functions. Based on this dyadic Green's function and integral equations, the NF-FF transformation is not necessary any more. To facilitate feasible near field measurements, only the tangential magnetic field is needed. As the proof of the concept, the radiations of Hertzian dipoles are analyzed. This approach can be directly used to characterize the radiation from PCBs and antennas. © 2011 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/140259 |
ISSN | 2020 SCImago Journal Rankings: 0.149 |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Li, P | en_HK |
dc.contributor.author | Jiang, L | en_HK |
dc.date.accessioned | 2011-09-23T06:09:20Z | - |
dc.date.available | 2011-09-23T06:09:20Z | - |
dc.date.issued | 2011 | en_HK |
dc.identifier.citation | The 2011 IEEE International Symposium on Electromagnetic Compatibility (EMC), Long Beach, CA., 14-19 August 2011. In IEEE EMC Symposium Record, 2011, p. 264-269 | en_HK |
dc.identifier.issn | 1077-4076 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/140259 | - |
dc.description.abstract | Conventionally the radiation emissions from PCB boards, electronic devices and antennas were characterized through the near field (NF)-far field (FF) transformation to find the equivalent sources. In this paper, a new methodology without NF-FF transformation is presented. Based on the uniqueness theorem, it only employs the measured tangential field over a spherical surface to rigorously characterize the outward radiation emission. The dyadic Green's function for the perfect magnetic conductor (PMC) sphere is derived using spherical wave functions. Based on this dyadic Green's function and integral equations, the NF-FF transformation is not necessary any more. To facilitate feasible near field measurements, only the tangential magnetic field is needed. As the proof of the concept, the radiations of Hertzian dipoles are analyzed. This approach can be directly used to characterize the radiation from PCBs and antennas. © 2011 IEEE. | en_HK |
dc.language | eng | en_US |
dc.publisher | IEEE. | - |
dc.relation.ispartof | IEEE International Symposium on Electromagnetic Compatibility Symposium Record | en_HK |
dc.subject | Characterization methods | - |
dc.subject | Dyadic green's functions | - |
dc.subject | Electronic device | - |
dc.subject | Equivalent source | - |
dc.subject | Far field | - |
dc.title | A novel characterization method of the radiation emission for electromagnetic compatibility | en_HK |
dc.type | Conference_Paper | en_HK |
dc.identifier.email | Jiang, L:ljiang@eee.hku.hk | en_HK |
dc.identifier.authority | Jiang, L=rp01338 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1109/ISEMC.2011.6038321 | en_HK |
dc.identifier.scopus | eid_2-s2.0-80054730018 | en_HK |
dc.identifier.hkuros | 195269 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-80054730018&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.spage | 264 | en_HK |
dc.identifier.epage | 269 | en_HK |
dc.publisher.place | United States | en_HK |
dc.description.other | The 2011 IEEE International Symposium on Electromagnetic Compatibility (EMC), Long Beach, CA., 14-19 August 2011. In IEEE EMC Symposium Record, 2011, p. 264-269 | - |
dc.identifier.scopusauthorid | Li, P=35069715100 | en_HK |
dc.identifier.scopusauthorid | Jiang, L=36077777200 | en_HK |
dc.identifier.issnl | 1077-4076 | - |