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Conference Paper: A novel characterization method of the radiation emission for electromagnetic compatibility

TitleA novel characterization method of the radiation emission for electromagnetic compatibility
Authors
KeywordsCharacterization methods
Dyadic green's functions
Electronic device
Equivalent source
Far field
Issue Date2011
PublisherIEEE.
Citation
The 2011 IEEE International Symposium on Electromagnetic Compatibility (EMC), Long Beach, CA., 14-19 August 2011. In IEEE EMC Symposium Record, 2011, p. 264-269 How to Cite?
AbstractConventionally the radiation emissions from PCB boards, electronic devices and antennas were characterized through the near field (NF)-far field (FF) transformation to find the equivalent sources. In this paper, a new methodology without NF-FF transformation is presented. Based on the uniqueness theorem, it only employs the measured tangential field over a spherical surface to rigorously characterize the outward radiation emission. The dyadic Green's function for the perfect magnetic conductor (PMC) sphere is derived using spherical wave functions. Based on this dyadic Green's function and integral equations, the NF-FF transformation is not necessary any more. To facilitate feasible near field measurements, only the tangential magnetic field is needed. As the proof of the concept, the radiations of Hertzian dipoles are analyzed. This approach can be directly used to characterize the radiation from PCBs and antennas. © 2011 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/140259
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorLi, Pen_HK
dc.contributor.authorJiang, Len_HK
dc.date.accessioned2011-09-23T06:09:20Z-
dc.date.available2011-09-23T06:09:20Z-
dc.date.issued2011en_HK
dc.identifier.citationThe 2011 IEEE International Symposium on Electromagnetic Compatibility (EMC), Long Beach, CA., 14-19 August 2011. In IEEE EMC Symposium Record, 2011, p. 264-269en_HK
dc.identifier.issn1077-4076en_HK
dc.identifier.urihttp://hdl.handle.net/10722/140259-
dc.description.abstractConventionally the radiation emissions from PCB boards, electronic devices and antennas were characterized through the near field (NF)-far field (FF) transformation to find the equivalent sources. In this paper, a new methodology without NF-FF transformation is presented. Based on the uniqueness theorem, it only employs the measured tangential field over a spherical surface to rigorously characterize the outward radiation emission. The dyadic Green's function for the perfect magnetic conductor (PMC) sphere is derived using spherical wave functions. Based on this dyadic Green's function and integral equations, the NF-FF transformation is not necessary any more. To facilitate feasible near field measurements, only the tangential magnetic field is needed. As the proof of the concept, the radiations of Hertzian dipoles are analyzed. This approach can be directly used to characterize the radiation from PCBs and antennas. © 2011 IEEE.en_HK
dc.languageengen_US
dc.publisherIEEE.-
dc.relation.ispartofIEEE International Symposium on Electromagnetic Compatibility Symposium Recorden_HK
dc.rightsIEEE International Symposium on Electromagnetic Compatibility Symposium Record. Copyright © IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rights©2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.subjectCharacterization methods-
dc.subjectDyadic green's functions-
dc.subjectElectronic device-
dc.subjectEquivalent source-
dc.subjectFar field-
dc.titleA novel characterization method of the radiation emission for electromagnetic compatibilityen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailJiang, L:ljiang@eee.hku.hken_HK
dc.identifier.authorityJiang, L=rp01338en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/ISEMC.2011.6038321en_HK
dc.identifier.scopuseid_2-s2.0-80054730018en_HK
dc.identifier.hkuros195269en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-80054730018&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage264en_HK
dc.identifier.epage269en_HK
dc.publisher.placeUnited Statesen_HK
dc.description.otherThe 2011 IEEE International Symposium on Electromagnetic Compatibility (EMC), Long Beach, CA., 14-19 August 2011. In IEEE EMC Symposium Record, 2011, p. 264-269-
dc.identifier.scopusauthoridLi, P=35069715100en_HK
dc.identifier.scopusauthoridJiang, L=36077777200en_HK

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