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Article: Microstructures of YBa85Eu0.15Cu3O7−δ superconducting films grown on SrTiO3 and YSZ substrates

TitleMicrostructures of YBa85Eu0.15Cu3O7−δ superconducting films grown on SrTiO3 and YSZ substrates
Authors
Xie, QYGu, MQQian, BWu, XSJiang, ZSZou, JGao, J
KeywordsA1. Defects
A1. Surface structure
A1. Transmission electron microscopy
B1. Cuprates
B1. Perovskites
B2. Superconducting materials
Issue Date2011
PublisherElsevier B.V. The Journal's web site is located at http://www.elsevier.com/locate/jcrysgro
Citation
Journal of Crystal Growth, 2011, v. 318 n. 1, p. 580-585 How to Cite?
DOI: http://dx.doi.org/10.1016/j.jcrysgro.2010.09.060
Persistent Identifierhttp://hdl.handle.net/10722/139629
ISI Accession Number ID
WOS:000289653900123

 

DC FieldValueLanguage
dc.contributor.authorXie, QYen_US
dc.contributor.authorGu, MQen_US
dc.contributor.authorQian, Ben_US
dc.contributor.authorWu, XSen_US
dc.contributor.authorJiang, ZSen_US
dc.contributor.authorZou, Jen_US
dc.contributor.authorGao, Jen_US
dc.date.accessioned2011-09-23T05:52:46Z-
dc.date.available2011-09-23T05:52:46Z-
dc.date.issued2011en_US
dc.identifier.citationJournal of Crystal Growth, 2011, v. 318 n. 1, p. 580-585en_US
dc.identifier.urihttp://hdl.handle.net/10722/139629-
dc.languageengen_US
dc.publisherElsevier B.V. The Journal's web site is located at http://www.elsevier.com/locate/jcrysgroen_US
dc.relation.ispartofJournal of Crystal Growthen_US
dc.subjectA1. Defects-
dc.subjectA1. Surface structure-
dc.subjectA1. Transmission electron microscopy-
dc.subjectB1. Cuprates-
dc.subjectB1. Perovskites-
dc.subjectB2. Superconducting materials-
dc.titleMicrostructures of YBa85Eu0.15Cu3O7−δ superconducting films grown on SrTiO3 and YSZ substratesen_US
dc.typeArticleen_US
dc.identifier.emailGao, J: jugao@hku.hken_US
dc.identifier.authorityGao, J=rp00699en_US
dc.identifier.doi10.1016/j.jcrysgro.2010.09.060-
dc.identifier.scopuseid_2-s2.0-79952736887-
dc.identifier.hkuros195366en_US
dc.identifier.volume318en_US
dc.identifier.spage580en_US
dc.identifier.epage585en_US
dc.identifier.isiWOS:000289653900123-

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