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Conference Paper: Review of noise sources in magnetic tunnel junction sensors

TitleReview of noise sources in magnetic tunnel junction sensors
Authors
Lei, ZLi, GEgelhoff, WFLai, PTPong, PWT
KeywordsJohnson noise
Magnetic noise
Magnetic tunnel junction (MTJ)
Shot noise
Thermal noise
1/f noise
Issue Date2011
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Citation
The 2010 Asia-Pacific Data Storage Conference (APDSC'10), Hualien, Taiwan, 27-29 October 2010. In IEEE Transactions on Magnetics, 2011, v. 47 n. 3, p. 602-612 How to Cite?
DOI: http://dx.doi.org/10.1109/TMAG.2010.2100814
AbstractNoise problem limits the sensitivity of magnetic tunnel junction (MTJ) sensors for ultra-low magnetic field applications. Noise analysis not only helps in finding ways to eliminate noise disturbances but also essential for understanding the electronic and magnetic properties of MTJs. These approaches provide insight for optimizing the design of MTJ sensors before fabrication. This paper reviews the noise sources in MTJ sensors reported in recent years. Both the origins and mathematical derivations of the noise sources are presented, illustrating how different factors affecting the performance of MTJ sensors. A brief outlook of challenges in the future is also given. © 2011 IEEE.
DescriptionThis journal issue contain selected papers from the Asia-Pacific Data Storage Conference 2010
Invited Oral Presentation: M-13
Persistent Identifierhttp://hdl.handle.net/10722/137296
ISSN
0018-9464
2023 Impact Factor: 2.1
2023 SCImago Journal Rankings: 0.729
ISI Accession Number ID
WOS:000287861800025
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorLei, Zen_HK
dc.contributor.authorLi, Gen_HK
dc.contributor.authorEgelhoff, WFen_HK
dc.contributor.authorLai, PTen_HK
dc.contributor.authorPong, PWTen_HK
dc.date.accessioned2011-08-26T14:22:42Z-
dc.date.available2011-08-26T14:22:42Z-
dc.date.issued2011en_HK
dc.identifier.citationThe 2010 Asia-Pacific Data Storage Conference (APDSC'10), Hualien, Taiwan, 27-29 October 2010. In IEEE Transactions on Magnetics, 2011, v. 47 n. 3, p. 602-612en_HK
dc.identifier.issn0018-9464en_HK
dc.identifier.urihttp://hdl.handle.net/10722/137296-
dc.descriptionThis journal issue contain selected papers from the Asia-Pacific Data Storage Conference 2010-
dc.descriptionInvited Oral Presentation: M-13-
dc.description.abstractNoise problem limits the sensitivity of magnetic tunnel junction (MTJ) sensors for ultra-low magnetic field applications. Noise analysis not only helps in finding ways to eliminate noise disturbances but also essential for understanding the electronic and magnetic properties of MTJs. These approaches provide insight for optimizing the design of MTJ sensors before fabrication. This paper reviews the noise sources in MTJ sensors reported in recent years. Both the origins and mathematical derivations of the noise sources are presented, illustrating how different factors affecting the performance of MTJ sensors. A brief outlook of challenges in the future is also given. © 2011 IEEE.en_HK
dc.languageengen_US
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20en_HK
dc.relation.ispartofIEEE Transactions on Magneticsen_HK
dc.subjectJohnson noiseen_HK
dc.subjectMagnetic noiseen_HK
dc.subjectMagnetic tunnel junction (MTJ)en_HK
dc.subjectShot noiseen_HK
dc.subjectThermal noiseen_HK
dc.subject1/f noise-
dc.titleReview of noise sources in magnetic tunnel junction sensorsen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailLai, PT: laip@eee.hku.hken_HK
dc.identifier.emailPong, PWT: ppong@eee.hku.hken_HK
dc.identifier.authorityLai, PT=rp00130en_HK
dc.identifier.authorityPong, PWT=rp00217en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMAG.2010.2100814en_HK
dc.identifier.scopuseid_2-s2.0-79952141090en_HK
dc.identifier.hkuros191531en_US
dc.identifier.hkuros197501-
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dc.identifier.hkuros227858-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79952141090&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume47en_HK
dc.identifier.issue3en_HK
dc.identifier.spage602en_HK
dc.identifier.epage612en_HK
dc.identifier.isiWOS:000287861800025-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridLei, ZQ=37002974000en_HK
dc.identifier.scopusauthoridLi, GJ=24780810800en_HK
dc.identifier.scopusauthoridEglehoff, WF=7006151986en_HK
dc.identifier.scopusauthoridLai, PT=7202946460en_HK
dc.identifier.scopusauthoridPong, PWT=24071267900en_HK
dc.identifier.citeulike9311926-
dc.customcontrol.immutablesml 130904-
dc.identifier.issnl0018-9464-

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