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Article: Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils
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TitleThickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils
 
AuthorsYang, B1
Cai, LH1
Ng, CK1
Ling, CC1
Fung, S1
 
KeywordsPositron induced secondary electron emission
Sickafus law
 
Issue Date2011
 
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimb
 
CitationNuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526 [How to Cite?]
DOI: http://dx.doi.org/10.1016/j.nimb.2011.04.107
 
AbstractSecondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. © 2011 Elsevier B.V. All rights reserved.
 
ISSN0168-583X
2012 Impact Factor: 1.266
2012 SCImago Journal Rankings: 0.593
 
DOIhttp://dx.doi.org/10.1016/j.nimb.2011.04.107
 
ISI Accession Number IDWOS:000292118800011
Funding AgencyGrant Number
Research Grant Council of the Hong Kong Special Administrative Region, ChinaHKU7021/10P
Funding Information:

The work described in this paper is supported by the GRF Grant from the Research Grant Council of the Hong Kong Special Administrative Region, China (under Project No. HKU7021/10P).

 
ReferencesReferences in Scopus
 
DC FieldValue
dc.contributor.authorYang, B
 
dc.contributor.authorCai, LH
 
dc.contributor.authorNg, CK
 
dc.contributor.authorLing, CC
 
dc.contributor.authorFung, S
 
dc.date.accessioned2011-07-27T01:34:11Z
 
dc.date.available2011-07-27T01:34:11Z
 
dc.date.issued2011
 
dc.description.abstractSecondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. © 2011 Elsevier B.V. All rights reserved.
 
dc.description.naturepostprint
 
dc.identifier.citationNuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526 [How to Cite?]
DOI: http://dx.doi.org/10.1016/j.nimb.2011.04.107
 
dc.identifier.citeulike9236599
 
dc.identifier.doihttp://dx.doi.org/10.1016/j.nimb.2011.04.107
 
dc.identifier.eissn1872-9584
 
dc.identifier.epage1526
 
dc.identifier.hkuros186824
 
dc.identifier.isiWOS:000292118800011
Funding AgencyGrant Number
Research Grant Council of the Hong Kong Special Administrative Region, ChinaHKU7021/10P
Funding Information:

The work described in this paper is supported by the GRF Grant from the Research Grant Council of the Hong Kong Special Administrative Region, China (under Project No. HKU7021/10P).

 
dc.identifier.issn0168-583X
2012 Impact Factor: 1.266
2012 SCImago Journal Rankings: 0.593
 
dc.identifier.issue13
 
dc.identifier.scopuseid_2-s2.0-79957624522
 
dc.identifier.spage1523
 
dc.identifier.urihttp://hdl.handle.net/10722/135365
 
dc.identifier.volume269
 
dc.languageeng
 
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimb
 
dc.publisher.placeNetherlands
 
dc.relation.ispartofNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
 
dc.relation.referencesReferences in Scopus
 
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
 
dc.rightsNOTICE: this is the author’s version of a work that was accepted for publication in Nuclear Instruments & Methods in Physics Research Section B Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments & Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 2011, v. 269 n. 13, p. 1523-1526. DOI: 10.1016/j.nimb.2011.04.107
 
dc.subjectPositron induced secondary electron emission
 
dc.subjectSickafus law
 
dc.titleThickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils
 
dc.typeArticle
 
<?xml encoding="utf-8" version="1.0"?>
<item><contributor.author>Yang, B</contributor.author>
<contributor.author>Cai, LH</contributor.author>
<contributor.author>Ng, CK</contributor.author>
<contributor.author>Ling, CC</contributor.author>
<contributor.author>Fung, S</contributor.author>
<date.accessioned>2011-07-27T01:34:11Z</date.accessioned>
<date.available>2011-07-27T01:34:11Z</date.available>
<date.issued>2011</date.issued>
<identifier.citation>Nuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526</identifier.citation>
<identifier.issn>0168-583X</identifier.issn>
<identifier.uri>http://hdl.handle.net/10722/135365</identifier.uri>
<description.abstract>Secondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0&#956;g/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield &#947; has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter &#923;=&#947;/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. &#169; 2011 Elsevier B.V. All rights reserved.</description.abstract>
<language>eng</language>
<publisher>Elsevier BV. The Journal&apos;s web site is located at http://www.elsevier.com/locate/nimb</publisher>
<relation.ispartof>Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms</relation.ispartof>
<rights>Creative Commons: Attribution 3.0 Hong Kong License</rights>
<rights>NOTICE: this is the author&#8217;s version of a work that was accepted for publication in Nuclear Instruments &amp; Methods in Physics Research Section B Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments &amp; Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 2011, v. 269 n. 13, p. 1523-1526. DOI: 10.1016/j.nimb.2011.04.107</rights>
<subject>Positron induced secondary electron emission</subject>
<subject>Sickafus law</subject>
<title>Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils</title>
<type>Article</type>
<description.nature>postprint</description.nature>
<identifier.doi>10.1016/j.nimb.2011.04.107</identifier.doi>
<identifier.scopus>eid_2-s2.0-79957624522</identifier.scopus>
<identifier.hkuros>186824</identifier.hkuros>
<relation.references>http://www.scopus.com/mlt/select.url?eid=2-s2.0-79957624522&amp;selection=ref&amp;src=s&amp;origin=recordpage</relation.references>
<identifier.volume>269</identifier.volume>
<identifier.issue>13</identifier.issue>
<identifier.spage>1523</identifier.spage>
<identifier.epage>1526</identifier.epage>
<identifier.eissn>1872-9584</identifier.eissn>
<identifier.isi>WOS:000292118800011</identifier.isi>
<publisher.place>Netherlands</publisher.place>
<identifier.citeulike>9236599</identifier.citeulike>
<bitstream.url>http://hub.hku.hk/bitstream/10722/135365/1/Content.pdf</bitstream.url>
</item>
Author Affiliations
  1. The University of Hong Kong