File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils

TitleThickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils
Authors
KeywordsPositron induced secondary electron emission
Sickafus law
Issue Date2011
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimb
Citation
Nuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526 How to Cite?
Abstract
Secondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. © 2011 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/135365
ISSN
2013 Impact Factor: 1.186
2013 SCImago Journal Rankings: 0.752
ISI Accession Number ID
Funding AgencyGrant Number
Research Grant Council of the Hong Kong Special Administrative Region, ChinaHKU7021/10P
Funding Information:

The work described in this paper is supported by the GRF Grant from the Research Grant Council of the Hong Kong Special Administrative Region, China (under Project No. HKU7021/10P).

References

 

Author Affiliations
  1. The University of Hong Kong
DC FieldValueLanguage
dc.contributor.authorYang, Ben_HK
dc.contributor.authorCai, LHen_HK
dc.contributor.authorNg, CKen_HK
dc.contributor.authorLing, CCen_HK
dc.contributor.authorFung, Sen_HK
dc.date.accessioned2011-07-27T01:34:11Z-
dc.date.available2011-07-27T01:34:11Z-
dc.date.issued2011en_HK
dc.identifier.citationNuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526en_HK
dc.identifier.issn0168-583Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/135365-
dc.description.abstractSecondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. © 2011 Elsevier B.V. All rights reserved.en_HK
dc.languageengen_US
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimben_HK
dc.relation.ispartofNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atomsen_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsNOTICE: this is the author’s version of a work that was accepted for publication in Nuclear Instruments & Methods in Physics Research Section B Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments & Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 2011, v. 269 n. 13, p. 1523-1526. DOI: 10.1016/j.nimb.2011.04.107-
dc.subjectPositron induced secondary electron emissionen_HK
dc.subjectSickafus lawen_HK
dc.titleThickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foilsen_HK
dc.typeArticleen_HK
dc.identifier.emailLing, CC: ccling@hkucc.hku.hken_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.authorityLing, CC=rp00747en_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.description.naturepostprint-
dc.identifier.doi10.1016/j.nimb.2011.04.107en_HK
dc.identifier.scopuseid_2-s2.0-79957624522en_HK
dc.identifier.hkuros186824en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79957624522&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume269en_HK
dc.identifier.issue13en_HK
dc.identifier.spage1523en_HK
dc.identifier.epage1526en_HK
dc.identifier.eissn1872-9584-
dc.identifier.isiWOS:000292118800011-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridYang, B=7404472939en_HK
dc.identifier.scopusauthoridCai, LH=37033546700en_HK
dc.identifier.scopusauthoridNg, CK=39861750400en_HK
dc.identifier.scopusauthoridLing, CC=13310239300en_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK
dc.identifier.citeulike9236599-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats