Article: Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils
| Title | Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils | ||||
|---|---|---|---|---|---|
| Authors | Yang, B1 Cai, LH1 Ng, CK1 Ling, CC1 Fung, S1 | ||||
| Keywords | Positron induced secondary electron emission Sickafus law | ||||
| Issue Date | 2011 | ||||
| Publisher | Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimb | ||||
| Citation | Nuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526 [How to Cite?] DOI: http://dx.doi.org/10.1016/j.nimb.2011.04.107 | ||||
| Abstract | Secondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. © 2011 Elsevier B.V. All rights reserved. | ||||
| ISSN | 0168-583X 2011 Impact Factor: 1.211 2011 SCImago Journal Rankings: 0.088 | ||||
| DOI | http://dx.doi.org/10.1016/j.nimb.2011.04.107 | ||||
| ISI Accession Number ID | WOS:000292118800011
Funding Information: The work described in this paper is supported by the GRF Grant from the Research Grant Council of the Hong Kong Special Administrative Region, China (under Project No. HKU7021/10P). | ||||
| References | References in Scopus |
| dc.contributor.author | Yang, B | ||||
|---|---|---|---|---|---|
| dc.contributor.author | Cai, LH | ||||
| dc.contributor.author | Ng, CK | ||||
| dc.contributor.author | Ling, CC | ||||
| dc.contributor.author | Fung, S | ||||
| dc.date.accessioned | 2011-07-27T01:34:11Z | ||||
| dc.date.available | 2011-07-27T01:34:11Z | ||||
| dc.date.issued | 2011 | ||||
| dc.description.abstract | Secondary electron (SE) emission from thin carbon foils induced by 1-20 keV positrons has been investigated over a range of nominal foil thicknesses from 1.0to5.0μg/cm 2. The measurement of SEs was carried out in forward geometry using a microchannel plate as a detector. The SE yield γ has been measured as a function of beam energy and compared with our Monte Carlo simulation results. We also present in this paper the material parameter Λ=γ/(dE/dx) and the emitted SE energy spectra. For incident positron energy of 5 keV or higher, the distribution is found to be characterized by the Sickafus form, AE- m and m is close to 1. For low energy incident positrons, however, another form, Bexp(-E/t), is proposed for describing the SE distribution. © 2011 Elsevier B.V. All rights reserved. | ||||
| dc.description.nature | postprint | ||||
| dc.identifier.citation | Nuclear Instruments And Methods In Physics Research, Section B: Beam Interactions With Materials And Atoms, 2011, v. 269 n. 13, p. 1523-1526 [How to Cite?] DOI: http://dx.doi.org/10.1016/j.nimb.2011.04.107 | ||||
| dc.identifier.citeulike | 9236599 | ||||
| dc.identifier.doi | http://dx.doi.org/10.1016/j.nimb.2011.04.107 | ||||
| dc.identifier.epage | 1526 | ||||
| dc.identifier.hkuros | 186824 | ||||
| dc.identifier.isi | WOS:000292118800011
Funding Information: The work described in this paper is supported by the GRF Grant from the Research Grant Council of the Hong Kong Special Administrative Region, China (under Project No. HKU7021/10P). | ||||
| dc.identifier.issn | 0168-583X 2011 Impact Factor: 1.211 2011 SCImago Journal Rankings: 0.088 | ||||
| dc.identifier.issue | 13 | ||||
| dc.identifier.scopus | eid_2-s2.0-79957624522 | ||||
| dc.identifier.spage | 1523 | ||||
| dc.identifier.uri | http://hdl.handle.net/10722/135365 | ||||
| dc.identifier.volume | 269 | ||||
| dc.language | eng | ||||
| dc.publisher | Elsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/nimb | ||||
| dc.publisher.place | Netherlands | ||||
| dc.relation.ispartof | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | ||||
| dc.relation.references | References in Scopus | ||||
| dc.rights | NOTICE: this is the author’s version of a work that was accepted for publication in Nuclear Instruments & Methods in Physics Research Section B Beam Interactions with Materials and Atoms. Changes resulting from the publishing process, such as peer review, editing, corrections, structural formatting, and other quality control mechanisms may not be reflected in this document. Changes may have been made to this work since it was submitted for publication. A definitive version was subsequently published in Nuclear Instruments & Methods in Physics Research Section B Beam Interactions with Materials and Atoms, 2011, v. 269 n. 13, p. 1523-1526. DOI: 10.1016/j.nimb.2011.04.107 | ||||
| dc.rights | Creative Commons: Attribution 3.0 Hong Kong License | ||||
| dc.subject | Positron induced secondary electron emission | ||||
| dc.subject | Sickafus law | ||||
| dc.title | Thickness dependence of positron induced secondary electron emission in forward geometry from thin carbon foils | ||||
| dc.type | Article |
Author Affiliations
- The University of Hong Kong