File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Nanoindentation using an atomic force microscope

TitleNanoindentation using an atomic force microscope
Authors
Keywordsatomic force microscope
deformation
elasticity
nanoindentation
viscoelasticity
Issue Date2011
PublisherTaylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.asp
Citation
Philosophical Magazine, 2011, v. 91 n. 7-9, p. 1329-1338 How to Cite?
AbstractThe elastic moduli of a range of polymers were characterized by nanoindentation on an atomic force microscope (AFM), using a recently proposed protocol involving a jump in the sample displacement rate. In this method any viscous behavior of the sample would not react to the rate jump, so that the response of the sample reflects only its elastic behavior. By assuming that the AFM tip is a flat-ended punch, this method involves calibration of only two cantilever tip-specific parameters. Experiments were conducted on PMMA at 353 K using load schedules comprising two such rate jumps in sequence and with different magnitudes. The results indicate that PMMA exhibits a constant elastic modulus at the test temperature, and that the AFM tip used is well described by the flat-ended punch approximation. © 2011 Taylor & Francis.
Persistent Identifierhttp://hdl.handle.net/10722/134411
ISSN
2014 Impact Factor: 1.825
2013 SCImago Journal Rankings: 1.014
ISI Accession Number ID
Funding AgencyGrant Number
Research Grants Council of the Hong Kong Special Administration Region, P.R. ChinaHKU7156/08E
University Grants Committee of the Hong Kong Special Administration Region, P.R. ChinaSEG-HKU06
Croucher Foundation
Funding Information:

The work described in this paper was supported by grants from the Research Grants Council (Project No. HKU7156/08E), as well as from the University Grants Committee (Project No. SEG-HKU06) of the Hong Kong Special Administration Region, P.R. China. AHWN would like to acknowledge support in the form of a Senior Research Fellowship from the Croucher Foundation. We acknowledge Mr. Zhi Wei Sun of Zhejiang University for carrying out part of the experiments reported in this paper. We also thank Dr. Warren Oliver for helpful discussion.

References

 

DC FieldValueLanguage
dc.contributor.authorTang, Ben_HK
dc.contributor.authorNgan, AHWen_HK
dc.date.accessioned2011-06-17T09:20:08Z-
dc.date.available2011-06-17T09:20:08Z-
dc.date.issued2011en_HK
dc.identifier.citationPhilosophical Magazine, 2011, v. 91 n. 7-9, p. 1329-1338en_HK
dc.identifier.issn1478-6435en_HK
dc.identifier.urihttp://hdl.handle.net/10722/134411-
dc.description.abstractThe elastic moduli of a range of polymers were characterized by nanoindentation on an atomic force microscope (AFM), using a recently proposed protocol involving a jump in the sample displacement rate. In this method any viscous behavior of the sample would not react to the rate jump, so that the response of the sample reflects only its elastic behavior. By assuming that the AFM tip is a flat-ended punch, this method involves calibration of only two cantilever tip-specific parameters. Experiments were conducted on PMMA at 353 K using load schedules comprising two such rate jumps in sequence and with different magnitudes. The results indicate that PMMA exhibits a constant elastic modulus at the test temperature, and that the AFM tip used is well described by the flat-ended punch approximation. © 2011 Taylor & Francis.en_HK
dc.languageengen_US
dc.publisherTaylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.aspen_HK
dc.relation.ispartofPhilosophical Magazineen_HK
dc.subjectatomic force microscopeen_HK
dc.subjectdeformationen_HK
dc.subjectelasticityen_HK
dc.subjectnanoindentationen_HK
dc.subjectviscoelasticityen_HK
dc.titleNanoindentation using an atomic force microscopeen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1478-6435&volume=91&issue=7-9&spage=1329&epage=1338&date=2011&atitle=Nanoindentation+using+an+atomic+force+microscope-
dc.identifier.emailTang, B: tangbin@hkucc.hku.hken_HK
dc.identifier.emailNgan, AHW: hwngan@hkucc.hku.hken_HK
dc.identifier.authorityTang, B=rp00081en_HK
dc.identifier.authorityNgan, AHW=rp00225en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1080/14786431003745351en_HK
dc.identifier.scopuseid_2-s2.0-79952666059en_HK
dc.identifier.hkuros185589en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79952666059&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume91en_HK
dc.identifier.issue7-9en_HK
dc.identifier.spage1329en_HK
dc.identifier.epage1338en_HK
dc.identifier.isiWOS:000288003700023-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridTang, B=24554184100en_HK
dc.identifier.scopusauthoridNgan, AHW=7006827202en_HK
dc.identifier.citeulike9000194-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats