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Article: Nanoindentation using an atomic force microscope
Title | Nanoindentation using an atomic force microscope | ||||||||
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Authors | |||||||||
Keywords | atomic force microscope deformation elasticity nanoindentation viscoelasticity | ||||||||
Issue Date | 2011 | ||||||||
Publisher | Taylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.asp | ||||||||
Citation | Philosophical Magazine, 2011, v. 91 n. 7-9, p. 1329-1338 How to Cite? | ||||||||
Abstract | The elastic moduli of a range of polymers were characterized by nanoindentation on an atomic force microscope (AFM), using a recently proposed protocol involving a jump in the sample displacement rate. In this method any viscous behavior of the sample would not react to the rate jump, so that the response of the sample reflects only its elastic behavior. By assuming that the AFM tip is a flat-ended punch, this method involves calibration of only two cantilever tip-specific parameters. Experiments were conducted on PMMA at 353 K using load schedules comprising two such rate jumps in sequence and with different magnitudes. The results indicate that PMMA exhibits a constant elastic modulus at the test temperature, and that the AFM tip used is well described by the flat-ended punch approximation. © 2011 Taylor & Francis. | ||||||||
Persistent Identifier | http://hdl.handle.net/10722/134411 | ||||||||
ISSN | 2023 Impact Factor: 1.5 2023 SCImago Journal Rankings: 0.366 | ||||||||
ISI Accession Number ID |
Funding Information: The work described in this paper was supported by grants from the Research Grants Council (Project No. HKU7156/08E), as well as from the University Grants Committee (Project No. SEG-HKU06) of the Hong Kong Special Administration Region, P.R. China. AHWN would like to acknowledge support in the form of a Senior Research Fellowship from the Croucher Foundation. We acknowledge Mr. Zhi Wei Sun of Zhejiang University for carrying out part of the experiments reported in this paper. We also thank Dr. Warren Oliver for helpful discussion. | ||||||||
References |
DC Field | Value | Language |
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dc.contributor.author | Tang, B | en_HK |
dc.contributor.author | Ngan, AHW | en_HK |
dc.date.accessioned | 2011-06-17T09:20:08Z | - |
dc.date.available | 2011-06-17T09:20:08Z | - |
dc.date.issued | 2011 | en_HK |
dc.identifier.citation | Philosophical Magazine, 2011, v. 91 n. 7-9, p. 1329-1338 | en_HK |
dc.identifier.issn | 1478-6435 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/134411 | - |
dc.description.abstract | The elastic moduli of a range of polymers were characterized by nanoindentation on an atomic force microscope (AFM), using a recently proposed protocol involving a jump in the sample displacement rate. In this method any viscous behavior of the sample would not react to the rate jump, so that the response of the sample reflects only its elastic behavior. By assuming that the AFM tip is a flat-ended punch, this method involves calibration of only two cantilever tip-specific parameters. Experiments were conducted on PMMA at 353 K using load schedules comprising two such rate jumps in sequence and with different magnitudes. The results indicate that PMMA exhibits a constant elastic modulus at the test temperature, and that the AFM tip used is well described by the flat-ended punch approximation. © 2011 Taylor & Francis. | en_HK |
dc.language | eng | en_US |
dc.publisher | Taylor & Francis Ltd. The Journal's web site is located at http://www.tandf.co.uk/journals/titles/14786435.asp | en_HK |
dc.relation.ispartof | Philosophical Magazine | en_HK |
dc.subject | atomic force microscope | en_HK |
dc.subject | deformation | en_HK |
dc.subject | elasticity | en_HK |
dc.subject | nanoindentation | en_HK |
dc.subject | viscoelasticity | en_HK |
dc.title | Nanoindentation using an atomic force microscope | en_HK |
dc.type | Article | en_HK |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1478-6435&volume=91&issue=7-9&spage=1329&epage=1338&date=2011&atitle=Nanoindentation+using+an+atomic+force+microscope | - |
dc.identifier.email | Tang, B: tangbin@hkucc.hku.hk | en_HK |
dc.identifier.email | Ngan, AHW: hwngan@hkucc.hku.hk | en_HK |
dc.identifier.authority | Tang, B=rp00081 | en_HK |
dc.identifier.authority | Ngan, AHW=rp00225 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1080/14786431003745351 | en_HK |
dc.identifier.scopus | eid_2-s2.0-79952666059 | en_HK |
dc.identifier.hkuros | 185589 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-79952666059&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 91 | en_HK |
dc.identifier.issue | 7-9 | en_HK |
dc.identifier.spage | 1329 | en_HK |
dc.identifier.epage | 1338 | en_HK |
dc.identifier.isi | WOS:000288003700023 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Tang, B=24554184100 | en_HK |
dc.identifier.scopusauthorid | Ngan, AHW=7006827202 | en_HK |
dc.identifier.citeulike | 9000194 | - |
dc.identifier.issnl | 1478-6435 | - |