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- Publisher Website: 10.1504/IJIEI.2011.040178
- WOS: WOS:000214112500004
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Article: A Markovian infectious model for dependent default risk
Title | A Markovian infectious model for dependent default risk |
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Authors | |
Keywords | Dependent default risk Markovian infectious models Common shocks Multi-sector modelling Chain reaction |
Issue Date | 2011 |
Publisher | Inderscience Publishers. The Journal's web site is located at http://www.inderscience.com/IJIEI |
Citation | International Journal of Intelligent Engineering Informatics, 2011, v. 1 n. 2, p. 174-195 How to Cite? |
Abstract | Modelling dependent defaults has long been a central issue for credit risk measurement and management. To address this important issue, we introduce a Markovian infectious model to describe the dependent relationship of default processes of credit securities. The central tenant of the proposed model is the concept of common shocks which is one of the major approaches to describe insurance risk. Using real data default data, we compare the proposed model to some existing default risk models, such as one-sector and two-sector models discussed in Ching et al. (2008, 2010). A log likelihood ratio test is adopted for the purpose of model comparison. Our empirical results reveal that the proposed model outperforms both the one-sector and two-sector models. We also illustrate the application of the proposed model for quantitative risk measurement. In particular, numerical results for both the crisis value-at-risk and the crisis expected shortfall are provided. |
Persistent Identifier | http://hdl.handle.net/10722/133627 |
ISSN | 2023 Impact Factor: 1.6 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Gu, JW | en_US |
dc.contributor.author | Ching, WK | en_US |
dc.contributor.author | Siu, TK | en_US |
dc.date.accessioned | 2011-05-24T02:12:20Z | - |
dc.date.available | 2011-05-24T02:12:20Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.citation | International Journal of Intelligent Engineering Informatics, 2011, v. 1 n. 2, p. 174-195 | en_US |
dc.identifier.issn | 1758-8715 | - |
dc.identifier.uri | http://hdl.handle.net/10722/133627 | - |
dc.description.abstract | Modelling dependent defaults has long been a central issue for credit risk measurement and management. To address this important issue, we introduce a Markovian infectious model to describe the dependent relationship of default processes of credit securities. The central tenant of the proposed model is the concept of common shocks which is one of the major approaches to describe insurance risk. Using real data default data, we compare the proposed model to some existing default risk models, such as one-sector and two-sector models discussed in Ching et al. (2008, 2010). A log likelihood ratio test is adopted for the purpose of model comparison. Our empirical results reveal that the proposed model outperforms both the one-sector and two-sector models. We also illustrate the application of the proposed model for quantitative risk measurement. In particular, numerical results for both the crisis value-at-risk and the crisis expected shortfall are provided. | - |
dc.language | eng | en_US |
dc.publisher | Inderscience Publishers. The Journal's web site is located at http://www.inderscience.com/IJIEI | - |
dc.relation.ispartof | International Journal of Intelligent Engineering Informatics | en_US |
dc.rights | International Journal of Intelligent Engineering Informatics. Copyright © Inderscience Publishers. | - |
dc.subject | Dependent default risk | - |
dc.subject | Markovian infectious models | - |
dc.subject | Common shocks | - |
dc.subject | Multi-sector modelling | - |
dc.subject | Chain reaction | - |
dc.title | A Markovian infectious model for dependent default risk | en_US |
dc.type | Article | en_US |
dc.identifier.openurl | http://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1758-8715&volume=1&issue=2&spage=174&epage=195&date=2011&atitle=A+Markovian+Infectious+Model+for+Dependent+Default+Risk | - |
dc.identifier.email | Ching, WK: wching@hku.hk | en_US |
dc.identifier.email | Siu, TK: ken.siu@efs.mq.edu.au | en_US |
dc.identifier.doi | 10.1504/IJIEI.2011.040178 | - |
dc.identifier.hkuros | 185364 | en_US |
dc.identifier.volume | 1 | en_US |
dc.identifier.issue | 2 | - |
dc.identifier.spage | 174 | en_US |
dc.identifier.epage | 195 | en_US |
dc.identifier.isi | WOS:000214112500004 | - |
dc.identifier.issnl | 1758-8715 | - |