Article: The van der Waals epitaxy of Bi 2Se 3 on the vicinal Si(111) surface: An approach for preparing high-quality thin films of a topological insulator

File Download Links for fulltext
(May Require Subscription)
Supplementary
  • Basic View
  • Metadata View
  • XML View
TitleThe van der Waals epitaxy of Bi 2Se 3 on the vicinal Si(111) surface: An approach for preparing high-quality thin films of a topological insulator
AuthorsLi, HD1 2
Wang, ZY1
Kan, X1
Guo, X1
He, HT3
Wang, Z3
Wang, JN3
Wong, TL3
Wang, N3
Xie, MH1
KeywordsAs-grown
Epifilms
Growth front
Growth of thin films
Growth parameters
Issue Date2010
PublisherInstitute of Physics Publishing Ltd. The Journal's web site is located at http://www.iop.org/EJ/journal/NJP
CitationNew Journal Of Physics, 2010, v. 12 [How to Cite?]
DOI: http://dx.doi.org/10.1088/1367-2630/12/10/103038
AbstractThe epitaxial growth of thin films of the topological insulator Bi 2Se 3 on nominally flat and vicinal Si(111) substrates was studied. In order to achieve a planar growth front and better quality epifilms, a two-step growth method was adopted for the van der Waals epitaxy of Bi 2Se 3 to proceed. By using vicinal Si(111) substrate surfaces, the in-plane growth rate anisotropy of Bi 2Se 3 was exploited in order to achieve single crystalline Bi 2Se 3 epifilms, in which threading defects and twins are effectively suppressed. The optimization of the growth parameters has resulted in the vicinal Bi 2Se 3 films showing a carrier mobility of ∼2000 cm 2 V -1 s -1 and a background doping of ∼ 3×10 18 cm -3 of the as-grown layers. Such samples not only show a relatively high magnetoresistance but also show a linear dependence on the magnetic field. © IOP Publishing Ltd. and Deutsche Physikalische Gesellschaft.
ISSN1367-2630
2011 Impact Factor: 4.177
2011 SCImago Journal Rankings: 0.367
DOIhttp://dx.doi.org/10.1088/1367-2630/12/10/103038
ISI Accession Number IDWOS:000284769700001
Funding AgencyGrant Number
University Grants Committee of Hong Kong Special Administrative Region (HKSAR)SEG CUHK06
Research Grant Council of HKSAR, ChinaHKU 10/CRF/08
HKU
Funding Information:

We are grateful to W K Ho for technical support in the growth experiments and to Stephen S Y Chui for assistance with XRD experiments. The PPMS facilities used for the magneto-transport measurements are supported by a Special Equipment Grant (SEG CUHK06) from the University Grants Committee of Hong Kong Special Administrative Region (HKSAR). This work was financially supported by a Collaborative Research Fund from the Research Grant Council of HKSAR, China, under grant no. HKU 10/CRF/08, and by a Seed Fund for Basic Research from HKU.

ReferencesReferences in Scopus
DC Field
Value
dc.contributor.authorLi, HD
dc.contributor.authorWang, ZY
dc.contributor.authorKan, X
dc.contributor.authorGuo, X
dc.contributor.authorHe, HT
dc.contributor.authorWang, Z
dc.contributor.authorWang, JN
dc.contributor.authorWong, TL
dc.contributor.authorWang, N
dc.contributor.authorXie, MH
dc.date.accessioned2010-12-23T08:35:39Z
dc.date.available2010-12-23T08:35:39Z
dc.date.issued2010
dc.description.abstractThe epitaxial growth of thin films of the topological insulator Bi 2Se 3 on nominally flat and vicinal Si(111) substrates was studied. In order to achieve a planar growth front and better quality epifilms, a two-step growth method was adopted for the van der Waals epitaxy of Bi 2Se 3 to proceed. By using vicinal Si(111) substrate surfaces, the in-plane growth rate anisotropy of Bi 2Se 3 was exploited in order to achieve single crystalline Bi 2Se 3 epifilms, in which threading defects and twins are effectively suppressed. The optimization of the growth parameters has resulted in the vicinal Bi 2Se 3 films showing a carrier mobility of ∼2000 cm 2 V -1 s -1 and a background doping of ∼ 3×10 18 cm -3 of the as-grown layers. Such samples not only show a relatively high magnetoresistance but also show a linear dependence on the magnetic field. © IOP Publishing Ltd. and Deutsche Physikalische Gesellschaft.
dc.description.naturepublished_or_final_version
dc.identifier.citationNew Journal Of Physics, 2010, v. 12 [How to Cite?]
DOI: http://dx.doi.org/10.1088/1367-2630/12/10/103038
dc.identifier.doihttp://dx.doi.org/10.1088/1367-2630/12/10/103038
dc.identifier.hkuros183248
dc.identifier.isiWOS:000284769700001
Funding AgencyGrant Number
University Grants Committee of Hong Kong Special Administrative Region (HKSAR)SEG CUHK06
Research Grant Council of HKSAR, ChinaHKU 10/CRF/08
HKU
Funding Information:

We are grateful to W K Ho for technical support in the growth experiments and to Stephen S Y Chui for assistance with XRD experiments. The PPMS facilities used for the magneto-transport measurements are supported by a Special Equipment Grant (SEG CUHK06) from the University Grants Committee of Hong Kong Special Administrative Region (HKSAR). This work was financially supported by a Collaborative Research Fund from the Research Grant Council of HKSAR, China, under grant no. HKU 10/CRF/08, and by a Seed Fund for Basic Research from HKU.

dc.identifier.issn1367-2630
2011 Impact Factor: 4.177
2011 SCImago Journal Rankings: 0.367
dc.identifier.openurl
dc.identifier.scopuseid_2-s2.0-78149435081
dc.identifier.urihttp://hdl.handle.net/10722/129341
dc.identifier.volume12
dc.languageeng
dc.publisherInstitute of Physics Publishing Ltd. The Journal's web site is located at http://www.iop.org/EJ/journal/NJP
dc.publisher.placeUnited Kingdom
dc.relation.ispartofNew Journal of Physics
dc.relation.referencesReferences in Scopus
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
dc.rightsNew Journal of Physics. Copyright © Institute of Physics Publishing Ltd.
dc.subjectAs-grown
dc.subjectEpifilms
dc.subjectGrowth front
dc.subjectGrowth of thin films
dc.subjectGrowth parameters
dc.titleThe van der Waals epitaxy of Bi 2Se 3 on the vicinal Si(111) surface: An approach for preparing high-quality thin films of a topological insulator
dc.typeArticle
Author Affiliations
  1. The University of Hong Kong
  2. Beijing Jiaotong Daxue
  3. Hong Kong University of Science and Technology