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Conference Paper: Characteristics of quartz infrared stimulated luminescence (IRSL) at elevated temperatures

TitleCharacteristics of quartz infrared stimulated luminescence (IRSL) at elevated temperatures
Authors
KeywordsIRSL
OSL
Quartz
Thermal stability
Issue Date2009
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/radmeas
Citation
12th International Conference on Luminescence and Electron Spin Resonance Dating (LED 2008). In Radiation Measurements, 2009, v. 44 n. 5-6, p. 434-438 How to Cite?
AbstractThis paper presents the study of infrared stimulated luminescence (IRSL) at elevated temperatures from an annealed quartz sample. Trap parameters of the IRSL signals were measured using pulse-annealing experiments with different heating rates and compared with the equivalent results for the optically stimulated luminescence (OSL) obtained using blue light emitting diodes as the stimulation source. The results demonstrate that the IRSL signal comprises of only one component which is associated with the rapidly bleachable OSL traps; the OSL of this annealed quartz contains several components with different bleaching rates and different thermal stabilities. The lifetimes of the IRSL and OSL signals were estimated. A protocol for quartz dating using IRSL signals is proposed and is tested by recovery of given doses. © 2009 Elsevier Ltd. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/129156
ISSN
2015 Impact Factor: 1.071
2015 SCImago Journal Rankings: 0.592
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorFan, Aen_HK
dc.contributor.authorLi, SHen_HK
dc.contributor.authorLi, Ben_HK
dc.date.accessioned2010-12-23T08:33:10Z-
dc.date.available2010-12-23T08:33:10Z-
dc.date.issued2009en_HK
dc.identifier.citation12th International Conference on Luminescence and Electron Spin Resonance Dating (LED 2008). In Radiation Measurements, 2009, v. 44 n. 5-6, p. 434-438en_HK
dc.identifier.issn1350-4487en_HK
dc.identifier.urihttp://hdl.handle.net/10722/129156-
dc.description.abstractThis paper presents the study of infrared stimulated luminescence (IRSL) at elevated temperatures from an annealed quartz sample. Trap parameters of the IRSL signals were measured using pulse-annealing experiments with different heating rates and compared with the equivalent results for the optically stimulated luminescence (OSL) obtained using blue light emitting diodes as the stimulation source. The results demonstrate that the IRSL signal comprises of only one component which is associated with the rapidly bleachable OSL traps; the OSL of this annealed quartz contains several components with different bleaching rates and different thermal stabilities. The lifetimes of the IRSL and OSL signals were estimated. A protocol for quartz dating using IRSL signals is proposed and is tested by recovery of given doses. © 2009 Elsevier Ltd. All rights reserved.en_HK
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/radmeasen_HK
dc.relation.ispartofRadiation Measurementsen_HK
dc.subjectIRSLen_HK
dc.subjectOSLen_HK
dc.subjectQuartzen_HK
dc.subjectThermal stabilityen_HK
dc.titleCharacteristics of quartz infrared stimulated luminescence (IRSL) at elevated temperaturesen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1350-4487&volume=44&issue=5-6&spage=434&epage=438&date=2009&atitle=Characteristics+of+quartz+infrared+stimulated+luminescence+(IRSL)+at+elevated+temperatures-
dc.identifier.emailLi, SH:shli@hku.hken_HK
dc.identifier.emailLi, B:boli@hku.hken_HK
dc.identifier.authorityLi, SH=rp00740en_HK
dc.identifier.authorityLi, B=rp00736en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.radmeas.2009.02.019en_HK
dc.identifier.scopuseid_2-s2.0-70249083023en_HK
dc.identifier.hkuros177679en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-70249083023&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume44en_HK
dc.identifier.issue5-6en_HK
dc.identifier.spage434en_HK
dc.identifier.epage438en_HK
dc.identifier.isiWOS:000271334400005-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridFan, A=35071227800en_HK
dc.identifier.scopusauthoridLi, SH=24438103700en_HK
dc.identifier.scopusauthoridLi, B=36072316000en_HK
dc.identifier.citeulike5327861-

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