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Conference Paper: Patterned fabric defect detection using a motif-based approach

TitlePatterned fabric defect detection using a motif-based approach
Authors
KeywordsDefect detection
Lattice
Motif
Patterned fabric
Wallpaper group
Issue Date2006
PublisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000349
Citation
The 14th IEEE International Conference on Image Processing (ICIP), San Antonio, TX., 16-19 September 2007. In Proceedings of 14th ICIP, 2007, v. 2, p. II-33-II-36 How to Cite?
AbstractThis paper proposed a patterned fabric defect detection method for sixteen out of seventeen wallpaper groups using a motif-based approach. From the symmetry properties of motifs, the energy of moving subtraction and its variance among motifs are mapped onto an energy-variance space. By learning the distribution of defect-free and defective patterns in this space, boundaries conditions can be determined for defect detection purpose. The proposed method is evaluated on four wallpaper categories, from which all 16 wallpaper groups can be generalized. Altogether, 160 defect-free lattices samples are used for learning the decision boundaries; and 200 other defect-free and 138 other defective samples are used for testing. An overall detection accuracy has reached 93.61%, which outperforms previous approaches. © 2007 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/126127
ISBN
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorNgan, HYTen_HK
dc.contributor.authorPang, GKHen_HK
dc.contributor.authorYung, NHCen_HK
dc.date.accessioned2010-10-31T12:11:15Z-
dc.date.available2010-10-31T12:11:15Z-
dc.date.issued2006en_HK
dc.identifier.citationThe 14th IEEE International Conference on Image Processing (ICIP), San Antonio, TX., 16-19 September 2007. In Proceedings of 14th ICIP, 2007, v. 2, p. II-33-II-36en_HK
dc.identifier.isbn1-4244-1437-7-
dc.identifier.issn1522-4880en_HK
dc.identifier.urihttp://hdl.handle.net/10722/126127-
dc.description.abstractThis paper proposed a patterned fabric defect detection method for sixteen out of seventeen wallpaper groups using a motif-based approach. From the symmetry properties of motifs, the energy of moving subtraction and its variance among motifs are mapped onto an energy-variance space. By learning the distribution of defect-free and defective patterns in this space, boundaries conditions can be determined for defect detection purpose. The proposed method is evaluated on four wallpaper categories, from which all 16 wallpaper groups can be generalized. Altogether, 160 defect-free lattices samples are used for learning the decision boundaries; and 200 other defect-free and 138 other defective samples are used for testing. An overall detection accuracy has reached 93.61%, which outperforms previous approaches. © 2007 IEEE.en_HK
dc.languageengen_HK
dc.publisherIEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000349en_HK
dc.relation.ispartofProceedings of the IEEE International Conference on Image Processing, ICIP 2007en_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectDefect detectionen_HK
dc.subjectLatticeen_HK
dc.subjectMotifen_HK
dc.subjectPatterned fabricen_HK
dc.subjectWallpaper groupen_HK
dc.titlePatterned fabric defect detection using a motif-based approachen_HK
dc.typeConference_Paperen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=1522-4880&volume=2&spage=II&epage=33&date=2007&atitle=Patterned+fabric+defect+detection+using+a+motif-based+approach-
dc.identifier.emailPang, GKH:gpang@eee.hku.hken_HK
dc.identifier.emailYung, NHC:nyung@eee.hku.hken_HK
dc.identifier.authorityPang, GKH=rp00162en_HK
dc.identifier.authorityYung, NHC=rp00226en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/ICIP.2007.4379085en_HK
dc.identifier.scopuseid_2-s2.0-48149101989en_HK
dc.identifier.hkuros172012en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-48149101989&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume2en_HK
dc.identifier.spageII-33en_HK
dc.identifier.epageII-36en_HK
dc.publisher.placeUnited Statesen_HK
dc.description.otherThe 14th IEEE International Conference on Image Processing (ICIP), San Antonio, TX., 16-19 September 2007. In Proceedings of 14th ICIP, 2007, v. 2, p. II-33-II-36-
dc.identifier.scopusauthoridNgan, HYT=7102173824en_HK
dc.identifier.scopusauthoridPang, GKH=7103393283en_HK
dc.identifier.scopusauthoridYung, NHC=7003473369en_HK
dc.identifier.citeulike6019039-

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