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Article: Accurate determination of the index of refraction of polymer blend films by spectroscopic ellipsometry

TitleAccurate determination of the index of refraction of polymer blend films by spectroscopic ellipsometry
Authors
Issue Date2010
PublisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/journals/jpccck/
Citation
Journal Of Physical Chemistry C, 2010, v. 114 n. 35, p. 15094-15101 How to Cite?
AbstractTo model the performance of a bulk-heterojunction solar cell, it is necessary to obtain information about the index of refraction of the blend layer, which is typically determined by spectroscopic ellipsometry measurements. The optical functions of poly(3-hexylthiophene)-[6,6]-phenyl C 61-butyric acid methyl ester (P3HT-PCBM) blend films have been extensively studied. However, there is a large variation of the reported optical functions in the literature. Because of this fact, as well as the widespread use of P3HT-PCBM films in organic photovoltaics, we have selected this material system as an example and performed a detailed analysis of spectroscopic ellipsometry data. We illustrate the occurrence of multiple solutions and the importance of a dedicated methodology to reach a satisfactory unique solution. The proposed methodology involves the following steps: (1) multisample analysis; (2) independent thickness and surface characterization; (3) use of the adequate optical description of substrate; (4) thickness estimation from transparent range using Cauchy model; (5) fitting n and k in the entire range with fixed thickness; verify result is physically meaningful; (6) optimization of the parameters to be fitted; (7) repeating steps 5 and 6 with and without EMA layer to account for the surface roughness; (8) finally, and only if no satisfactory fit could be obtained from previous steps, attempts to introduce anisotropy, graded layers, or other nonideal models should follow. © 2010 American Chemical Society.
Persistent Identifierhttp://hdl.handle.net/10722/125286
ISSN
2015 Impact Factor: 4.509
2015 SCImago Journal Rankings: 1.995
ISI Accession Number ID
Funding AgencyGrant Number
Strategic Research Theme
University Development Fund
Small Project Grant and Outstanding Young Researcher Award
Hong Kong Research Grants CouncilHKBU202607
Hong Kong Baptist UniversityFRG/06-07/II-63
Croucher Foundation
CityU7002442
Funding Information:

This work was supported by the Strategic Research Theme, University Development Fund, and Small Project Grant and Outstanding Young Researcher Award (administrated by The University of Hong Kong) are also acknowledged. W.-Y.W. thanks the Hong Kong Research Grants Council for a GRF Grant (HKBU202607), the Hong Kong Baptist University for a Faculty Research Grant (FRG/06-07/II-63) and the Croucher Foundation for a Croucher Senior Research Fellowship. J.A.Z. thanks support from CityU Strategic Research Grants (7002442). The authors thank the Department of EEE, The University of Hong Kong for the use of spectroscopic ellipsometer, as well as Professor C. Surya and Dr. H. F. Lui from the Department of EIE, Hong Kong Polytechnic University for the use of atomic force microscopy (AFM). The authors would also like to thank Dr. Tom Tiwald from J. A. Woollam company for useful discussions concerning the fitting and help in fitting the optical functions of glass substrate.

References

 

DC FieldValueLanguage
dc.contributor.authorNg, Aen_HK
dc.contributor.authorLi, CHen_HK
dc.contributor.authorFung, MKen_HK
dc.contributor.authorDjuriŝić, ABen_HK
dc.contributor.authorZapien, JAen_HK
dc.contributor.authorChan, WKen_HK
dc.contributor.authorCheung, KYen_HK
dc.contributor.authorWong, WYen_HK
dc.date.accessioned2010-10-31T11:22:19Z-
dc.date.available2010-10-31T11:22:19Z-
dc.date.issued2010en_HK
dc.identifier.citationJournal Of Physical Chemistry C, 2010, v. 114 n. 35, p. 15094-15101en_HK
dc.identifier.issn1932-7447en_HK
dc.identifier.urihttp://hdl.handle.net/10722/125286-
dc.description.abstractTo model the performance of a bulk-heterojunction solar cell, it is necessary to obtain information about the index of refraction of the blend layer, which is typically determined by spectroscopic ellipsometry measurements. The optical functions of poly(3-hexylthiophene)-[6,6]-phenyl C 61-butyric acid methyl ester (P3HT-PCBM) blend films have been extensively studied. However, there is a large variation of the reported optical functions in the literature. Because of this fact, as well as the widespread use of P3HT-PCBM films in organic photovoltaics, we have selected this material system as an example and performed a detailed analysis of spectroscopic ellipsometry data. We illustrate the occurrence of multiple solutions and the importance of a dedicated methodology to reach a satisfactory unique solution. The proposed methodology involves the following steps: (1) multisample analysis; (2) independent thickness and surface characterization; (3) use of the adequate optical description of substrate; (4) thickness estimation from transparent range using Cauchy model; (5) fitting n and k in the entire range with fixed thickness; verify result is physically meaningful; (6) optimization of the parameters to be fitted; (7) repeating steps 5 and 6 with and without EMA layer to account for the surface roughness; (8) finally, and only if no satisfactory fit could be obtained from previous steps, attempts to introduce anisotropy, graded layers, or other nonideal models should follow. © 2010 American Chemical Society.en_HK
dc.languageengen_HK
dc.publisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/journals/jpccck/en_HK
dc.relation.ispartofJournal of Physical Chemistry Cen_HK
dc.titleAccurate determination of the index of refraction of polymer blend films by spectroscopic ellipsometryen_HK
dc.typeArticleen_HK
dc.identifier.emailDjuriŝić, AB: dalek@hku.hken_HK
dc.identifier.emailChan, WK: waichan@hku.hken_HK
dc.identifier.authorityDjuriŝić, AB=rp00690en_HK
dc.identifier.authorityChan, WK=rp00667en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1021/jp104398fen_HK
dc.identifier.scopuseid_2-s2.0-79951608073en_HK
dc.identifier.hkuros182101en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79951608073&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume114en_HK
dc.identifier.issue35en_HK
dc.identifier.spage15094en_HK
dc.identifier.epage15101en_HK
dc.identifier.isiWOS:000284520100063-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridNg, A=13806222700en_HK
dc.identifier.scopusauthoridLi, CH=37006677500en_HK
dc.identifier.scopusauthoridFung, MK=35191896100en_HK
dc.identifier.scopusauthoridDjuriŝić, AB=7004904830en_HK
dc.identifier.scopusauthoridZapien, JA=6701453903en_HK
dc.identifier.scopusauthoridChan, WK=13310083000en_HK
dc.identifier.scopusauthoridCheung, KY=25229974800en_HK
dc.identifier.scopusauthoridWong, WY=7403972153en_HK

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