Conference Paper: 4-11 Electrical characterization of defects at the gallium nitride based homo- and hetero-junctions
| Title | 4-11 Electrical characterization of defects at the gallium nitride based homo- and hetero-junctions |
|---|---|
| Authors | Chen, X Huang, Y Ling, FCC Fung, SHY Beling, CD |
| Issue Date | 2005 |
| Publisher | Sichuan University. |
| dc.contributor.author | Chen, X |
|---|---|
| dc.contributor.author | Huang, Y |
| dc.contributor.author | Ling, FCC |
| dc.contributor.author | Fung, SHY |
| dc.contributor.author | Beling, CD |
| dc.date.accessioned | 2010-09-26T01:38:12Z |
| dc.date.available | 2010-09-26T01:38:12Z |
| dc.date.issued | 2005 |
| dc.identifier.hkuros | 114270 |
| dc.identifier.spage | 41 |
| dc.identifier.uri | http://hdl.handle.net/10722/109809 |
| dc.language | eng |
| dc.publisher | Sichuan University. |
| dc.relation.ispartof | 第十五屆全國半導體物理年會: 論文摘要集 |
| dc.title | 4-11 Electrical characterization of defects at the gallium nitride based homo- and hetero-junctions |
| dc.type | Conference_Paper |