Showing results 1 to 2 of 2
| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
Analytical Post-Voiding Modeling and Efficient Characterization of EM Failure Effects Under Time-Dependent Current Stressing Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 7-Jun-2023 | |||
Multilayer Perceptron-Based Stress Evolution Analysis Under DC Current Stressing for Multisegment Wires Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 1-Feb-2023 |