Showing results 1 to 1 of 1
Title | Author(s) | Issue Date | |
---|---|---|---|
Reliability of Ultrathin High-κ Dielectrics on Chemical-vapor Deposited 2D Semiconductors Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 |
Title | Author(s) | Issue Date | |
---|---|---|---|
Reliability of Ultrathin High-κ Dielectrics on Chemical-vapor Deposited 2D Semiconductors Proceeding/Conference:International Electron Devices Meeting (IEDM) | 2020 |