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postgraduate thesis: Efficient numerical modeling of random surface roughness for interconnect internal impedance extraction

TitleEfficient numerical modeling of random surface roughness for interconnect internal impedance extraction
Authors
Chen, Quan陳全
Advisors
Advisor(s):Wong, NNg, TS
Issue Date2007
PublisherThe University of Hong Kong (Pokfulam, Hong Kong)
Citation
Chen, Q. [陳全]. (2007). Efficient numerical modeling of random surface roughness for interconnect internal impedance extraction. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3955708
DegreeMaster of Philosophy
SubjectSurface roughness - Mathematical models.
Electric conductors - Surfaces - Mathematical models.
Interconnects (Integrated circuit technology)
Dept/ProgramElectrical and Electronic Engineering
Persistent Identifierhttp://hdl.handle.net/10722/51558
HKU Library Item IDb3955708

 

DC FieldValueLanguage
dc.contributor.advisorWong, N-
dc.contributor.advisorNg, TS-
dc.contributor.authorChen, Quan-
dc.contributor.author陳全-
dc.date.issued2007-
dc.identifier.citationChen, Q. [陳全]. (2007). Efficient numerical modeling of random surface roughness for interconnect internal impedance extraction. (Thesis). University of Hong Kong, Pokfulam, Hong Kong SAR. Retrieved from http://dx.doi.org/10.5353/th_b3955708-
dc.identifier.urihttp://hdl.handle.net/10722/51558-
dc.languageeng-
dc.publisherThe University of Hong Kong (Pokfulam, Hong Kong)-
dc.relation.ispartofHKU Theses Online (HKUTO)-
dc.rightsThe author retains all proprietary rights, (such as patent rights) and the right to use in future works.-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.source.urihttp://hub.hku.hk/bib/B3955708X-
dc.subject.lcshSurface roughness - Mathematical models.-
dc.subject.lcshElectric conductors - Surfaces - Mathematical models.-
dc.subject.lcshInterconnects (Integrated circuit technology)-
dc.titleEfficient numerical modeling of random surface roughness for interconnect internal impedance extraction-
dc.typePG_Thesis-
dc.identifier.hkulb3955708-
dc.description.thesisnameMaster of Philosophy-
dc.description.thesislevelMaster-
dc.description.thesisdisciplineElectrical and Electronic Engineering-
dc.description.naturepublished_or_final_version-
dc.description.natureabstract-
dc.identifier.doi10.5353/th_b3955708-
dc.date.hkucongregation2008-
dc.identifier.mmsid991022669129703414-

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