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Conference Paper: Small-disturbance angle stability analysis of microgrids: a graph theory viewpoint

TitleSmall-disturbance angle stability analysis of microgrids: a graph theory viewpoint
Authors
Issue Date2015
PublisherIEEE. The Journal's website is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000166
Citation
The 2015 IEEE Conference on Control and Applications (CCA 2015), Sydney, Australia, 21-23 September 2015. In Conference Proceedings, 2015, p. 201-206 How to Cite?
AbstractThis paper is concerned with small-disturbance angle stability of microgrids from a graph theory perspective. Firstly, we build up the structure preserving model for microgrids, and introduce the concept of the active power flow graph, the Laplacian matrix and the critical lines. We show that small-disturbance stability is equivalent to the positive semi-definiteness of the Laplacian matrix, and it is the critical lines that cause instability. Then, we elaborate the impact of the critical lines on small-disturbance stability. A stability criterion is proposed, which is a matrix inequality in terms of the critical lines. This criterion also indicates the type of unstable equilibrium point (UEP) and can be considered as a supplement to eigenvalue-based small-disturbance analysis. The obtained results are validated by using a modified IEEE 9-bus test system.
DescriptionThe 2015 IEEE Multi-Conference on Systems and Control (MSC), Sydney, Australia, 21-23 September 2015.
MSC 2015 includes two international conferences sponsored and promoted by the IEEE Control Systems Society: The IEEE Conference on Control Applications (CCA) and The IEEE International Symposium on Intelligent Control (ISIC)
Persistent Identifierhttp://hdl.handle.net/10722/229782
ISSN
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorSong, Y-
dc.contributor.authorHill, DJ-
dc.contributor.authorLiu, T-
dc.date.accessioned2016-08-23T14:13:14Z-
dc.date.available2016-08-23T14:13:14Z-
dc.date.issued2015-
dc.identifier.citationThe 2015 IEEE Conference on Control and Applications (CCA 2015), Sydney, Australia, 21-23 September 2015. In Conference Proceedings, 2015, p. 201-206-
dc.identifier.issn1085-1992-
dc.identifier.urihttp://hdl.handle.net/10722/229782-
dc.descriptionThe 2015 IEEE Multi-Conference on Systems and Control (MSC), Sydney, Australia, 21-23 September 2015.-
dc.descriptionMSC 2015 includes two international conferences sponsored and promoted by the IEEE Control Systems Society: The IEEE Conference on Control Applications (CCA) and The IEEE International Symposium on Intelligent Control (ISIC)-
dc.description.abstractThis paper is concerned with small-disturbance angle stability of microgrids from a graph theory perspective. Firstly, we build up the structure preserving model for microgrids, and introduce the concept of the active power flow graph, the Laplacian matrix and the critical lines. We show that small-disturbance stability is equivalent to the positive semi-definiteness of the Laplacian matrix, and it is the critical lines that cause instability. Then, we elaborate the impact of the critical lines on small-disturbance stability. A stability criterion is proposed, which is a matrix inequality in terms of the critical lines. This criterion also indicates the type of unstable equilibrium point (UEP) and can be considered as a supplement to eigenvalue-based small-disturbance analysis. The obtained results are validated by using a modified IEEE 9-bus test system.-
dc.languageeng-
dc.publisherIEEE. The Journal's website is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000166-
dc.relation.ispartofIEEE Conference on Control Applications Proceedings-
dc.titleSmall-disturbance angle stability analysis of microgrids: a graph theory viewpoint-
dc.typeConference_Paper-
dc.identifier.emailHill, DJ: dhill@eee.hku.hk-
dc.identifier.emailLiu, T: taoliu@hku.hk-
dc.identifier.authorityHill, DJ=rp01669-
dc.identifier.authorityLiu, T=rp02045-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/CCA.2015.7320633-
dc.identifier.scopuseid_2-s2.0-84964329349-
dc.identifier.hkuros260044-
dc.identifier.hkuros266470-
dc.identifier.spage201-
dc.identifier.epage206-
dc.identifier.isiWOS:000369332000027-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 160831 ; 161003 - merged-
dc.identifier.issnl1085-1992-

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