Showing results 2 to 3 of 3
< previous
Title | Author(s) | Issue Date | Views | |
---|---|---|---|---|
Negative gate-bias instability of ZnO thin-film transistors studied by current–voltage and capacitance–voltage analyses Journal:Journal of Vacuum Science and Technology: Part B Nanotechnology & Microelectronics | 2014 | 109 | ||
2020 | 48 |