Browsing by Author Vatajelu, I.

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TitleAuthor(s)Issue DateViews
 
New reliability mechanisms in memory design for sub-22nm technologies
Proceeding/Conference:Proceedings of the 2011 IEEE 17th International On-Line Testing Symposium, IOLTS 2011
Aymerich, N.Asenov, A.Brown, A.Canal, R.Cheng, B.Figueras, J.Gonzalez, A.Herrero, E.Markov, S.Miranda, M.Pouyan, P.Ramirez, T.Rubio, A.Vatajelu, I.Vera, X.Wang, X.Zuber, P.
2011
41
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