Showing results 4 to 5 of 5
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| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
A New Optimization Cost Model for VLSI Standard Cell Placement Proceeding/Conference:Historic Title IEEE International Symposium on Circuits and Systems Proceedings | 1997 | 111 | ||
Psychometric assessment of ICILS test items on Hong Kong and Korean students: a Rasch analysis Proceeding/Conference:5th IEA-IRC 2013 | 2013 | 135 |