Showing results 11 to 15 of 15
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| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
Off-state instabilities in thermally nitrided-oxide n-MOSFETs Journal:IEEE Transactions on Electron Devices | 1993 | 161 | ||
On recovery of hot-carrier-induced mobility degradationin off-state thermally-nitrided-oxide N-MOSFET's Proceeding/Conference:Proceedings of the 3rd International Conference on Solid State and Integrated Circuit Technology | 1992 | 39 | ||
Oxide-trap-induced instability in GIDL of thermally nitrided-oxide N-MOSFET's under stress Journal:Electron device letters | 1992 | 122 | ||
The Migratory Beekeeping Routing Problem: Model and an Exact Algorithm Journal:INFORMS Journal on Computing | 2021 | 20 | ||
| 1990 | 205 |