Browsing by Author Ji, F

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TitleAuthor(s)Issue DateViews
Electrical characteristics of Al-doped ZnO-channel thin-film transistor with high-κ HfON/SiO 2 stack gate dielectric
Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
2010
133
Electrical properties of HfTiO gate-dielectric metal oxide semiconductor capacitors with NO and N 2O surface nitridations
Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010
2010
134
 
2007
197
 
2008
176
 
Impacts of Ti content and annealing temperature on electrical properties of Si MOS capacitors with HfTiON gate dielectric
Proceeding/Conference:2009 IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2009
2009
210
 
2012
53
 
2007
116
 
2011
206
 
2011
200
 
2012
73
 
Improved Memory Window of MONOS Memory Capacitor with GdON as Charge Storage Layer
Proceeding/Conference:I E E E Conference on Electron Devices and Solid-State Circuits Proceedings
2012
60
Influence of gate-electrode fringing capacitance on threshold voltage of nano-MOSFET
Proceeding/Conference:ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings
2007
246
 
Influence of natridation annealing of HfTiO on electrical properties of MOS device
Journal:Guti Dianzixue Yanjiu Yu Jinzhan/Research and Progress of Solid State Electronics
2008
128
 
2008
227
 
A novel MONOS memory with high-κ HfLaON as charge-storage layer
Journal:IEEE Transactions on Device and Materials Reliability
2011
185
 
2014
62
 
2007
110
 
Title: Real-world effectiveness and safety of interferon-free DAAS for 14,676 hepatitis C (CHC) patients with genotypes 1, 2, 3, 4 and 6: a multinational study
Proceeding/Conference:Poster presentation at the AASLD The Liver Meeting, November 12-15. 2021. Hepatology
2021
 
2012
64
 
Variational inference for cognitive diagnosis models
Proceeding/Conference:The Annual Meeting of the National Council on Measurement in Education (NCME), Virtual Meeting, 2020
2020
65