Showing results 28 to 31 of 31
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Title | Author(s) | Issue Date | Views | |
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Performance of nonvolatile memory by using band-engineered SrTiO 3/HfON stack as charge-trapping layer Journal:Microelectronics Reliability | 2012 | 96 | ||
Thermal and electrical characteristics of HfLaON with different nitridation annealings Proceeding/Conference:ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings | 2010 | 202 | ||
Y-Doped BaTiO3 as a Charge-Trapping Layer for Nonvolatile Memory Applications Journal:IEEE Electron Device Letters | 2016 | |||
YAlO x as inter-poly delectric for improved performance of flash-memory application Proceeding/Conference:2010 IEEE International Conference of Electron Devices and Solid-State Circuits, EDSSC 2010 | 2010 | 68 |