Browsing by Author Gong, M

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TitleAuthor(s)Issue DateViews
 
2006
216
 
2004
196
 
1999
208
 
2006
140
 
Film thickness degradation of Au/GaN Schottky contact characteristics
Journal:Materials Science and Engineering B: Solid-State Materials for Advanced Technology
2005
233
 
1998
129
 
1999
158
 
2002
170
Identities of the deep level defects E 1/E 2 in 6H silicon carbide
Proceeding/Conference:Materials Science Forum
2004
75
 
2009
176
 
2004
199
 
2005
197
 
Microstructure of the deep level defect E1/E2 in 6H silicon carbide
Proceeding/Conference:Bulletin of the American Physical Society
2004
118
 
A new method for speeding up ray tracing nurbs surfaces
Journal:Computers and Graphics (Pergamon)
1997
114
 
2018
15
 
2006
160
 
2015
82
 
2006
171
 
2019
58
Oxadiazole-triphenylamine derivatives for OLEDs
Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering
2005
148