Showing results 17 to 21 of 21
< previous
| Title | Author(s) | Issue Date | Views | |
|---|---|---|---|---|
Reference-free detection of semiconductor assembly defect Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2005 | 185 | ||
Regularized multiframe phase-shifting algorithm for three-dimensional profilometry Journal:Applied Optics | 2012 | 123 | ||
Structured-light based sensing using a single fixed fringe grating: Fringe boundary detection and 3-D reconstruction Journal:IEEE Transactions on Electronics Packaging Manufacturing | 2008 | 310 | ||
A three-dimensional imaging system for surface profilometry of moving objects Proceeding/Conference:IEEE International Workshop on Imaging Systems and Techniques Proceedings | 2013 | 49 | ||
Three-dimensional reconstruction of wafer solder bumps using binary pattern projection Proceeding/Conference:Proceedings of SPIE - The International Society for Optical Engineering | 2005 | 200 |