Showing results 4 to 5 of 5
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| Title | Author(s) | Issue Date | |
|---|---|---|---|
Permittivity of oxidized ultra-thin silicon films from atomistic simulations Journal:IEEE Electron Device Letters | 2015 | ||
Towards Atomic Level Simulation of Electron Devices Including the Semiconductor-Oxide Interface Proceeding/Conference:International Conference on Simulation of Semiconductor Processes and Devices Proceedings | 2014 |