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Article: Moiré-related in-gap states in a twisted MoS2/graphite heterojunction

TitleMoiré-related in-gap states in a twisted MoS<inf>2</inf>/graphite heterojunction
Authors
Issue Date2017
Citation
npj 2D Materials and Applications, 2017, v. 1, n. 1, article no. 24 How to Cite?
AbstractThis report presents a series of low-temperature (4.5 K) scanning tunneling microscopy and spectroscopy experimental results on monolayer MoS deposited on highly oriented pyrolytic graphite using chemical vapor deposition. To reveal the detailed connection between atomic morphology and conductivity in twisted MoS /graphite heterojunctions, we employ high-sensitivity tunneling spectroscopy measurements by choosing a reduced tip-sample distance. We discern previously unobserved conductance peaks within the band gap range of MoS , and by comparing the tunneling spectra from MoS grains of varying rotation with respect to the substrate, show that these features have small but non-negligible dependence on the moiré superstructure. Furthermore, within a single moiré supercell, atomically resolved tunneling spectroscopy measurements show that the spectra between the moiré high and low areas are also distinct. These in-gap states are shown to have an energy shift attributed to their local lattice strain, matching corresponding behavior of the conduction band edge, and we therefore infer that these features are intrinsic to the density of states, rather than experimental artifacts, and attribute them to the twisted stacking and local strain energy of the MoS /graphite heterointerface. 2 2 2 2 2
Persistent Identifierhttp://hdl.handle.net/10722/298297
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLu, Chun I.-
dc.contributor.authorButler, Christopher J.-
dc.contributor.authorHuang, Jing Kai-
dc.contributor.authorChu, Yu Hsun-
dc.contributor.authorYang, Hung Hsiang-
dc.contributor.authorWei, Ching Ming-
dc.contributor.authorLi, Lain Jong-
dc.contributor.authorLin, Minn Tsong-
dc.date.accessioned2021-04-08T03:08:06Z-
dc.date.available2021-04-08T03:08:06Z-
dc.date.issued2017-
dc.identifier.citationnpj 2D Materials and Applications, 2017, v. 1, n. 1, article no. 24-
dc.identifier.urihttp://hdl.handle.net/10722/298297-
dc.description.abstractThis report presents a series of low-temperature (4.5 K) scanning tunneling microscopy and spectroscopy experimental results on monolayer MoS deposited on highly oriented pyrolytic graphite using chemical vapor deposition. To reveal the detailed connection between atomic morphology and conductivity in twisted MoS /graphite heterojunctions, we employ high-sensitivity tunneling spectroscopy measurements by choosing a reduced tip-sample distance. We discern previously unobserved conductance peaks within the band gap range of MoS , and by comparing the tunneling spectra from MoS grains of varying rotation with respect to the substrate, show that these features have small but non-negligible dependence on the moiré superstructure. Furthermore, within a single moiré supercell, atomically resolved tunneling spectroscopy measurements show that the spectra between the moiré high and low areas are also distinct. These in-gap states are shown to have an energy shift attributed to their local lattice strain, matching corresponding behavior of the conduction band edge, and we therefore infer that these features are intrinsic to the density of states, rather than experimental artifacts, and attribute them to the twisted stacking and local strain energy of the MoS /graphite heterointerface. 2 2 2 2 2-
dc.languageeng-
dc.relation.ispartofnpj 2D Materials and Applications-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleMoiré-related in-gap states in a twisted MoS<inf>2</inf>/graphite heterojunction-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1038/s41699-017-0030-6-
dc.identifier.scopuseid_2-s2.0-85062521838-
dc.identifier.volume1-
dc.identifier.issue1-
dc.identifier.spagearticle no. 24-
dc.identifier.epagearticle no. 24-
dc.identifier.eissn2397-7132-
dc.identifier.isiWOS:000406650900001-
dc.identifier.issnl2397-7132-

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