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Article: Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

TitleYield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices
Authors
Lanza, MarioSmets, QuentinHuyghebaert, CedricLi, Lain Jong
Issue Date2020
Citation
Nature Communications, 2020, v. 11, n. 1, article no. 5689 How to Cite?
DOI: http://dx.doi.org/10.1038/s41467-020-19053-9
Persistent Identifierhttp://hdl.handle.net/10722/297990
PubMed Central ID
PMC7655834
ISI Accession Number ID
WOS:000593978400004

 

DC FieldValueLanguage
dc.contributor.authorLanza, Mario-
dc.contributor.authorSmets, Quentin-
dc.contributor.authorHuyghebaert, Cedric-
dc.contributor.authorLi, Lain Jong-
dc.date.accessioned2021-04-08T03:07:25Z-
dc.date.available2021-04-08T03:07:25Z-
dc.date.issued2020-
dc.identifier.citationNature Communications, 2020, v. 11, n. 1, article no. 5689-
dc.identifier.urihttp://hdl.handle.net/10722/297990-
dc.languageeng-
dc.relation.ispartofNature Communications-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleYield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1038/s41467-020-19053-9-
dc.identifier.pmid33173041-
dc.identifier.pmcidPMC7655834-
dc.identifier.scopuseid_2-s2.0-85095785783-
dc.identifier.volume11-
dc.identifier.issue1-
dc.identifier.spagearticle no. 5689-
dc.identifier.epagearticle no. 5689-
dc.identifier.eissn2041-1723-
dc.identifier.isiWOS:000593978400004-
dc.identifier.issnl2041-1723-

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