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Article: Resolution enhancement in an extended depth of field for volumetric two-photon microscopy

TitleResolution enhancement in an extended depth of field for volumetric two-photon microscopy
Authors
KeywordsConventional methods
Extended depth of field
Fast volumetric imaging
Lateral resolution
Multiple orders
Issue Date2020
PublisherOptical Society of America. The Journal's web site is located at http://www.opticsinfobase.org/current.cfm?journal=3
Citation
Optics Letters, 2020, v. 45 n. 11, p. 3054-3057 How to Cite?
AbstractThe resolution enhancement over the extended depth of field (DOF) in the volumetric two-photon microscopy (TPM) is demonstrated by utilizing multiple orders of Bessel beams. Here the conventional method of switching laser modes (SLAM) in 2D is introduced to 3D, denoted as the volumetric SLAM (V-SLAM). The equivalent scanning beam in the TPM is a thin needle-like beam, which is generated from the subtraction between the needle-like 0th-order and the straw-like 1st-order Bessel beams. Compared with the 0th-order Bessel beam, the lateral resolution of the V-SLAM is increased by 28.6% and maintains over the axial depth of 56 µm. The V-SLAM performance is evaluated by employing fluorescent beads and a mouse brain slice. The V-SLAM approach provides a promising solution to improve the lateral resolutions for fast volumetric imaging on sparsely distributed samples.
Persistent Identifierhttp://hdl.handle.net/10722/289589
ISSN
2019 Impact Factor: 3.714
2015 SCImago Journal Rankings: 2.397

 

DC FieldValueLanguage
dc.contributor.authorHE, H-
dc.contributor.authorKONG, C-
dc.contributor.authorCHAN, KY-
dc.contributor.authorSO, WL-
dc.contributor.authorFOK, HK-
dc.contributor.authorRen, YX-
dc.contributor.authorLai, CSW-
dc.contributor.authorTsia, KK-
dc.contributor.authorWong, KKY-
dc.date.accessioned2020-10-22T08:14:45Z-
dc.date.available2020-10-22T08:14:45Z-
dc.date.issued2020-
dc.identifier.citationOptics Letters, 2020, v. 45 n. 11, p. 3054-3057-
dc.identifier.issn0146-9592-
dc.identifier.urihttp://hdl.handle.net/10722/289589-
dc.description.abstractThe resolution enhancement over the extended depth of field (DOF) in the volumetric two-photon microscopy (TPM) is demonstrated by utilizing multiple orders of Bessel beams. Here the conventional method of switching laser modes (SLAM) in 2D is introduced to 3D, denoted as the volumetric SLAM (V-SLAM). The equivalent scanning beam in the TPM is a thin needle-like beam, which is generated from the subtraction between the needle-like 0th-order and the straw-like 1st-order Bessel beams. Compared with the 0th-order Bessel beam, the lateral resolution of the V-SLAM is increased by 28.6% and maintains over the axial depth of 56 µm. The V-SLAM performance is evaluated by employing fluorescent beads and a mouse brain slice. The V-SLAM approach provides a promising solution to improve the lateral resolutions for fast volumetric imaging on sparsely distributed samples.-
dc.languageeng-
dc.publisherOptical Society of America. The Journal's web site is located at http://www.opticsinfobase.org/current.cfm?journal=3-
dc.relation.ispartofOptics Letters-
dc.rightsOptics Letters. Copyright © Optical Society of America.-
dc.rights© XXXX [year] Optical Society of America]. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.-
dc.subjectConventional methods-
dc.subjectExtended depth of field-
dc.subjectFast volumetric imaging-
dc.subjectLateral resolution-
dc.subjectMultiple orders-
dc.titleResolution enhancement in an extended depth of field for volumetric two-photon microscopy-
dc.typeArticle-
dc.identifier.emailRen, YX: yxren@hku.hk-
dc.identifier.emailLai, CSW: coraswl@hku.hk-
dc.identifier.emailTsia, KK: tsia@hku.hk-
dc.identifier.emailWong, KKY: kywong@eee.hku.hk-
dc.identifier.authorityLai, CSW=rp01895-
dc.identifier.authorityTsia, KK=rp01389-
dc.identifier.authorityWong, KKY=rp00189-
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1364/OL.394282-
dc.identifier.pmid32479457-
dc.identifier.scopuseid_2-s2.0-85085854192-
dc.identifier.hkuros316956-
dc.identifier.hkuros318987-
dc.identifier.volume45-
dc.identifier.issue11-
dc.identifier.spage3054-
dc.identifier.epage3057-
dc.publisher.placeUnited States-

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