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Article: Reflective interferometry for optical metamaterial phase measurements

TitleReflective interferometry for optical metamaterial phase measurements
Authors
Issue Date2012
Citation
Optics Letters, 2012, v. 37, n. 19, p. 4089-4091 How to Cite?
AbstractThe unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π-shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain-metamaterial systems. © 2012 Optical Society of America.
Persistent Identifierhttp://hdl.handle.net/10722/256654
ISSN
2017 Impact Factor: 3.589
2015 SCImago Journal Rankings: 2.397
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorO'Brien, Kevin-
dc.contributor.authorLanzillotti-Kimura, N. D.-
dc.contributor.authorSuchowski, Haim-
dc.contributor.authorKante, Boubacar-
dc.contributor.authorPark, Yongshik-
dc.contributor.authorYin, Xiaobo-
dc.contributor.authorZhang, Xiang-
dc.date.accessioned2018-07-24T08:57:31Z-
dc.date.available2018-07-24T08:57:31Z-
dc.date.issued2012-
dc.identifier.citationOptics Letters, 2012, v. 37, n. 19, p. 4089-4091-
dc.identifier.issn0146-9592-
dc.identifier.urihttp://hdl.handle.net/10722/256654-
dc.description.abstractThe unambiguous determination of optical refractive indices of metamaterials is a challenging task for device applications and the study of new optical phenomena. We demonstrate here simple broadband phase measurements of metamaterials using spectrally and spatially resolved interferometry. We study the phase response of a π-shaped metamaterial known to be an analog to electromagnetically induced transparency. The measured broadband interferograms give the phase delay or advance produced by the metamaterial in a single measurement. The presented technique offers an effective way of characterizing optical metamaterials including nonlinear and gain-metamaterial systems. © 2012 Optical Society of America.-
dc.languageeng-
dc.relation.ispartofOptics Letters-
dc.titleReflective interferometry for optical metamaterial phase measurements-
dc.typeArticle-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1364/OL.37.004089-
dc.identifier.scopuseid_2-s2.0-84867166751-
dc.identifier.volume37-
dc.identifier.issue19-
dc.identifier.spage4089-
dc.identifier.epage4091-
dc.identifier.eissn1539-4794-
dc.identifier.isiWOS:000309542900055-

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