File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Ion-trap measurements of electric-field noise near surfaces

TitleIon-trap measurements of electric-field noise near surfaces
Authors
Issue Date2015
PublisherAmerican Physical Society. The Journal's web site is located at http://rmp.aps.org
Citation
Reviews of Modern Physics, 2015, v. 87, p. 1419-1482 How to Cite?
AbstractElectric-field noise near surfaces is a common problem in diverse areas of physics and a limiting factor for many precision measurements. There are multiple mechanisms by which such noise is generated, many of which are poorly understood. Laser-cooled, trapped ions provide one of the most sensitive systems to probe electric-field noise at MHz frequencies and over a distance range 30−3000  μm from a surface. Over recent years numerous experiments have reported spectral densities of electric-field noise inferred from ion heating-rate measurements and several different theoretical explanations for the observed noise characteristics have been proposed. This paper provides an extensive summary and critical review of electric-field noise measurements in ion traps and compares these experimental findings with known and conjectured mechanisms for the origin of this noise. This reveals that the presence of multiple noise sources, as well as the different scalings added by geometrical considerations, complicates the interpretation of these results. It is thus the purpose of this review to assess which conclusions can be reasonably drawn from the existing data, and which important questions are still open. In so doing it provides a framework for future investigations of surface-noise processes.
Persistent Identifierhttp://hdl.handle.net/10722/248561
ISSN
2021 Impact Factor: 50.485
2020 SCImago Journal Rankings: 24.877
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorBrownnutt, MJ-
dc.contributor.authorKumph, M-
dc.contributor.authorRabl, P-
dc.contributor.authorBlatt, R-
dc.date.accessioned2017-10-18T08:45:05Z-
dc.date.available2017-10-18T08:45:05Z-
dc.date.issued2015-
dc.identifier.citationReviews of Modern Physics, 2015, v. 87, p. 1419-1482-
dc.identifier.issn0034-6861-
dc.identifier.urihttp://hdl.handle.net/10722/248561-
dc.description.abstractElectric-field noise near surfaces is a common problem in diverse areas of physics and a limiting factor for many precision measurements. There are multiple mechanisms by which such noise is generated, many of which are poorly understood. Laser-cooled, trapped ions provide one of the most sensitive systems to probe electric-field noise at MHz frequencies and over a distance range 30−3000  μm from a surface. Over recent years numerous experiments have reported spectral densities of electric-field noise inferred from ion heating-rate measurements and several different theoretical explanations for the observed noise characteristics have been proposed. This paper provides an extensive summary and critical review of electric-field noise measurements in ion traps and compares these experimental findings with known and conjectured mechanisms for the origin of this noise. This reveals that the presence of multiple noise sources, as well as the different scalings added by geometrical considerations, complicates the interpretation of these results. It is thus the purpose of this review to assess which conclusions can be reasonably drawn from the existing data, and which important questions are still open. In so doing it provides a framework for future investigations of surface-noise processes.-
dc.languageeng-
dc.publisherAmerican Physical Society. The Journal's web site is located at http://rmp.aps.org-
dc.relation.ispartofReviews of Modern Physics-
dc.rightsCopyright 2015 by The American Physical Society. This article is available online at https://doi.org/10.1103/RevModPhys.87.1419-
dc.titleIon-trap measurements of electric-field noise near surfaces-
dc.typeArticle-
dc.identifier.emailBrownnutt, MJ: mikeb@hku.hk-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1103/RevModPhys.87.1419-
dc.identifier.scopuseid_2-s2.0-84954137537-
dc.identifier.hkuros282385-
dc.identifier.volume87-
dc.identifier.spage1419-
dc.identifier.epage1482-
dc.identifier.isiWOS:000366173100001-
dc.publisher.placeUnited States-
dc.identifier.issnl0034-6861-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats