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Article: Investigation of the behaviour of electronic resistive switching memory based on MoSe2-doped ultralong Se microwires

TitleInvestigation of the behaviour of electronic resistive switching memory based on MoSe<font size=-1><sub>2</sub></font>-doped ultralong Se microwires
Authors
Issue Date2016
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2016, v. 109 n. 14, p. 143904:1-143904:5 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/242496
ISSN
2015 Impact Factor: 3.142
2015 SCImago Journal Rankings: 1.105

 

DC FieldValueLanguage
dc.contributor.authorZhou, GD-
dc.contributor.authorSun, B-
dc.contributor.authorYao, YQ-
dc.contributor.authorhang, HH-
dc.contributor.authorZhou, AK-
dc.contributor.authorAlameh, K-
dc.contributor.authorDing, BF-
dc.contributor.authorSong, QL-
dc.date.accessioned2017-07-24T01:40:32Z-
dc.date.available2017-07-24T01:40:32Z-
dc.date.issued2016-
dc.identifier.citationApplied Physics Letters, 2016, v. 109 n. 14, p. 143904:1-143904:5-
dc.identifier.issn0003-6951-
dc.identifier.urihttp://hdl.handle.net/10722/242496-
dc.languageeng-
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/-
dc.relation.ispartofApplied Physics Letters-
dc.rightsApplied Physics Letters. Copyright © American Institute of Physics.-
dc.rightsAfter publication: Copyright (2016) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in (Applied Physics Letters, 2016, v. 109 n. 14, p. 143904:1-143904:5) and may be found at (http://dx.doi.org/10.1063/1.4962655).-
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.-
dc.titleInvestigation of the behaviour of electronic resistive switching memory based on MoSe<font size=-1><sub>2</sub></font>-doped ultralong Se microwires-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.4962655-
dc.identifier.hkuros273273-
dc.identifier.volume109-
dc.identifier.issue14-
dc.identifier.spage143904:1-
dc.identifier.epage143904:5-
dc.publisher.placeUnited States-

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