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Article: An advanced PLS approach for key performance indicator-related prediction and diagnosis in case of outliers

TitleAn advanced PLS approach for key performance indicator-related prediction and diagnosis in case of outliers
Authors
Issue Date2016
PublisherIEEE. The Journal's web site is located at http://www.ewh.ieee.org/soc/ies/ties/index.html
Citation
IEEE Transactions on Industrial Electronics, 2016, v. 63 n. 4, p. 2587-2594 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/234670

 

DC FieldValueLanguage
dc.contributor.authorXIE, X-
dc.contributor.authorSun, W-
dc.contributor.authorCheung, KC-
dc.date.accessioned2016-10-14T13:48:24Z-
dc.date.available2016-10-14T13:48:24Z-
dc.date.issued2016-
dc.identifier.citationIEEE Transactions on Industrial Electronics, 2016, v. 63 n. 4, p. 2587-2594-
dc.identifier.urihttp://hdl.handle.net/10722/234670-
dc.languageeng-
dc.publisherIEEE. The Journal's web site is located at http://www.ewh.ieee.org/soc/ies/ties/index.html-
dc.relation.ispartofIEEE Transactions on Industrial Electronics-
dc.rightsIEEE Transactions on Industrial Electronics. Copyright © IEEE.-
dc.rights©20xx IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. -
dc.titleAn advanced PLS approach for key performance indicator-related prediction and diagnosis in case of outliers-
dc.typeArticle-
dc.identifier.emailCheung, KC: kccheung@hku.hk-
dc.identifier.authorityCheung, KC=rp01322-
dc.identifier.hkuros268933-
dc.identifier.volume63-
dc.identifier.issue4-
dc.identifier.spage2587-
dc.identifier.epage2594-

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