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Article: Optical and thermal analyses of thin-film hexagonal micro-mesh light-emitting diodes

TitleOptical and thermal analyses of thin-film hexagonal micro-mesh light-emitting diodes
Authors
Keywordsthin film
light extraction
Light-emitting diodes (LEDs)
Issue Date2013
Citation
IEEE Photonics Technology Letters, 2013, v. 25, n. 4, p. 374-377 How to Cite?
AbstractVertical thin-film light-emitting diodes (LEDs) with integrated micro-mesh arrays are reported. By removing the sapphire substrate through laser lift-off, vertical current conduction becomes possible, improving current spreading capability and thus electrical properties. Compared with the as-grown device, the thin-film micro-mesh LEDs emits 61% more optical power, attributed to enhanced light extraction through the micro-mesh, evidence of which is provided by confocal imaging. At 100 mA, the enhancement factor rises to > 100%, attributed to low junction temperatures due to efficient heat conduction as verified by infrared thermometric imaging. © 1989-2012 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/225052
ISSN
2015 Impact Factor: 1.945
2015 SCImago Journal Rankings: 1.433
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLi, Kwai Hei-
dc.contributor.authorCheung, Yuk Fai-
dc.contributor.authorZhang, Qian-
dc.contributor.authorChoi, Hoi Wai-
dc.date.accessioned2016-04-18T11:16:38Z-
dc.date.available2016-04-18T11:16:38Z-
dc.date.issued2013-
dc.identifier.citationIEEE Photonics Technology Letters, 2013, v. 25, n. 4, p. 374-377-
dc.identifier.issn1041-1135-
dc.identifier.urihttp://hdl.handle.net/10722/225052-
dc.description.abstractVertical thin-film light-emitting diodes (LEDs) with integrated micro-mesh arrays are reported. By removing the sapphire substrate through laser lift-off, vertical current conduction becomes possible, improving current spreading capability and thus electrical properties. Compared with the as-grown device, the thin-film micro-mesh LEDs emits 61% more optical power, attributed to enhanced light extraction through the micro-mesh, evidence of which is provided by confocal imaging. At 100 mA, the enhancement factor rises to > 100%, attributed to low junction temperatures due to efficient heat conduction as verified by infrared thermometric imaging. © 1989-2012 IEEE.-
dc.languageeng-
dc.relation.ispartofIEEE Photonics Technology Letters-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectthin film-
dc.subjectlight extraction-
dc.subjectLight-emitting diodes (LEDs)-
dc.titleOptical and thermal analyses of thin-film hexagonal micro-mesh light-emitting diodes-
dc.typeArticle-
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/LPT.2013.2238621-
dc.identifier.scopuseid_2-s2.0-84873319812-
dc.identifier.hkuros221361-
dc.identifier.volume25-
dc.identifier.issue4-
dc.identifier.spage374-
dc.identifier.epage377-
dc.identifier.isiWOS:000314684400016-

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