File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Knowledge and resilience

TitleKnowledge and resilience
Authors
Issue Date2015
PublisherCambridge University Press. The Journal's web site is located at http://journals.cambridge.org/action/displayJournal?jid=BBS
Citation
Behavioral and Brain Sciences, 2015, v. 38, p. 37-38, article no. e110 How to Cite?
AbstractKalisch et al. regard a positive appraisal style as the mechanism for promoting resilience. I argue that knowledge can enhance resilience without affecting appraisal style. Furthermore, the relationship between positive appraisals and resilience ought to be mediated by knowledge and is not monotonic. Finally, I raise some questions about how appraisals fit into the dual-process model of the mind.
DescriptionCommentary
Persistent Identifierhttp://hdl.handle.net/10722/217989

 

DC FieldValueLanguage
dc.contributor.authorLau, JYF-
dc.date.accessioned2015-09-18T06:20:24Z-
dc.date.available2015-09-18T06:20:24Z-
dc.date.issued2015-
dc.identifier.citationBehavioral and Brain Sciences, 2015, v. 38, p. 37-38, article no. e110-
dc.identifier.urihttp://hdl.handle.net/10722/217989-
dc.descriptionCommentary-
dc.description.abstractKalisch et al. regard a positive appraisal style as the mechanism for promoting resilience. I argue that knowledge can enhance resilience without affecting appraisal style. Furthermore, the relationship between positive appraisals and resilience ought to be mediated by knowledge and is not monotonic. Finally, I raise some questions about how appraisals fit into the dual-process model of the mind.-
dc.languageeng-
dc.publisherCambridge University Press. The Journal's web site is located at http://journals.cambridge.org/action/displayJournal?jid=BBS-
dc.relation.ispartofBehavioral and Brain Sciences-
dc.rightsBehavioral and Brain Sciences. Copyright © Cambridge University Press.-
dc.titleKnowledge and resilience-
dc.typeArticle-
dc.identifier.emailLau, JYF: jyflau@hku.hk-
dc.identifier.authorityLau, JYF=rp01223-
dc.identifier.doi10.1017/S0140525X14001605-
dc.identifier.hkuros254572-
dc.identifier.volume38, article no. e110-
dc.identifier.spage38, article no. e110-
dc.identifier.epage38-
dc.publisher.placeCambridge-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats