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Conference Paper: Sensing in the nano-environment based on high order harmonic modes of flexible arm

TitleSensing in the nano-environment based on high order harmonic modes of flexible arm
Authors
KeywordsMaterial sensing
Flexible cantilever
Atomic force microscopy
Issue Date2006
Citation
IFAC Proceedings Volumes (IFAC-PapersOnline), 2006, v. 4, n. PART 1, p. 806-811 How to Cite?
AbstractAn Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized flexible cantilever, which works as a flexible robot arm. The flexible cantilever is controlled to keep vibrating when an AFM works in the tapping mode. The cantilever is modeled as a flexible beam instead of a point mass system in this paper. The nonlinear interaction force between the tip and sample surface is also modeled. A simulation environment is developed to simulate the dynamics of cantilevers using the flexible beam model. Simulation results confirm that the flexible beam model can represent the system more accurately than the point-mass model. It has been shown that lower modes are more sensitive to changes of surface topography or surface materials when the cantilever is driven to vibrate at a higher harmonic mode. At the same time, this simulation environment also provides a more accurate way to validate the design of a new AFM probe and AFM controller than simulation packages which use the point-mass model.
Persistent Identifierhttp://hdl.handle.net/10722/213196
ISSN

 

DC FieldValueLanguage
dc.contributor.authorZhang, Jiangbo-
dc.contributor.authorXi, Ning-
dc.contributor.authorLi, Guangyong-
dc.date.accessioned2015-07-28T04:06:29Z-
dc.date.available2015-07-28T04:06:29Z-
dc.date.issued2006-
dc.identifier.citationIFAC Proceedings Volumes (IFAC-PapersOnline), 2006, v. 4, n. PART 1, p. 806-811-
dc.identifier.issn1474-6670-
dc.identifier.urihttp://hdl.handle.net/10722/213196-
dc.description.abstractAn Atomic Force Microscope (AFM) explores the topography of a sample surface using a micro-sized flexible cantilever, which works as a flexible robot arm. The flexible cantilever is controlled to keep vibrating when an AFM works in the tapping mode. The cantilever is modeled as a flexible beam instead of a point mass system in this paper. The nonlinear interaction force between the tip and sample surface is also modeled. A simulation environment is developed to simulate the dynamics of cantilevers using the flexible beam model. Simulation results confirm that the flexible beam model can represent the system more accurately than the point-mass model. It has been shown that lower modes are more sensitive to changes of surface topography or surface materials when the cantilever is driven to vibrate at a higher harmonic mode. At the same time, this simulation environment also provides a more accurate way to validate the design of a new AFM probe and AFM controller than simulation packages which use the point-mass model.-
dc.languageeng-
dc.relation.ispartofIFAC Proceedings Volumes (IFAC-PapersOnline)-
dc.subjectMaterial sensing-
dc.subjectFlexible cantilever-
dc.subjectAtomic force microscopy-
dc.titleSensing in the nano-environment based on high order harmonic modes of flexible arm-
dc.typeConference_Paper-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.scopuseid_2-s2.0-79961150063-
dc.identifier.volume4-
dc.identifier.issuePART 1-
dc.identifier.spage806-
dc.identifier.epage811-

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