File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Conference Paper: On-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations

TitleOn-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations
Authors
Issue Date2010
Citation
2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010, 2010, p. 71-74 How to Cite?
AbstractAtomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool. © 2010 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/213144

 

DC FieldValueLanguage
dc.contributor.authorSong, Bo-
dc.contributor.authorXi, Ning-
dc.contributor.authorYang, Ruiguo-
dc.contributor.authorLai, King Wai Chiu-
dc.contributor.authorQu, Chengeng-
dc.date.accessioned2015-07-28T04:06:16Z-
dc.date.available2015-07-28T04:06:16Z-
dc.date.issued2010-
dc.identifier.citation2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010, 2010, p. 71-74-
dc.identifier.urihttp://hdl.handle.net/10722/213144-
dc.description.abstractAtomic Force Microscopy (AFM) is a powerful and popular technique of single-molecule imaging both in air and liquid. Recent research and hardware development provide AFM with the function of manipulation nano-particle and modify sample surface in nano-scale. However, due to AFM usually takes several minutes to get an image and the surface change is hard to observe in real-time manipulation. In this paper, a novel approach for on-line sensing and display method is proposed and used for updating the surface change during the manipulation of cell. In this approach a cutting force detection model is used for cutting depth judgment. In addition, an adaptive local-scan strategy is involved here to get the topography of the local surface. Finally a display model is used to update the change of the surface during the manipulation. With this novel scheme the process of cell cutting become real-time visualized. So, AFM tip could work as an efficient nanolithography or cutting tool. © 2010 IEEE.-
dc.languageeng-
dc.relation.ispartof2010 IEEE Nanotechnology Materials and Devices Conference, NMDC2010-
dc.titleOn-line sensing and visual feedback for Atomic Force Microscopy (AFM) based nano-manipulations-
dc.typeConference_Paper-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1109/NMDC.2010.5651906-
dc.identifier.scopuseid_2-s2.0-78751555868-
dc.identifier.spage71-
dc.identifier.epage74-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats