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Conference Paper: Compensation of drift contamination in AFM image by local scan

TitleCompensation of drift contamination in AFM image by local scan
Authors
KeywordsNanomanipulation
Drift compensation
Atomic force microscope
Issue Date2008
Citation
2008 IEEE International Conference on Robotics and Biomimetics, ROBIO 2008, 2008, p. 487-492 How to Cite?
AbstractThermal drift in atomic force microscopy (AFM) is one of the major hurdles to achieve accurate and efficient AFM based nanomanipulation. AFM images are all contaminated by the thermal drift which often leads to failed manipulation operations. In this paper, a local scan strategy is applied to identify the thermal drift contamination in the AFM image and then the draft contamination is compensated. After an AFM image is captured, the entire image is divided into several strips along y direction. A local scan is immediately performed in each part of the image to determine the drift at that portion. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, and thus leading to improved accuracy of AFM image and enhanced efficiency in AFM based nanomanipulation. © 2008 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/213064

 

DC FieldValueLanguage
dc.contributor.authorWang, Yucai-
dc.contributor.authorLi, Guangyong-
dc.contributor.authorXi, Ning-
dc.contributor.authorLiu, Lianqing-
dc.date.accessioned2015-07-28T04:06:01Z-
dc.date.available2015-07-28T04:06:01Z-
dc.date.issued2008-
dc.identifier.citation2008 IEEE International Conference on Robotics and Biomimetics, ROBIO 2008, 2008, p. 487-492-
dc.identifier.urihttp://hdl.handle.net/10722/213064-
dc.description.abstractThermal drift in atomic force microscopy (AFM) is one of the major hurdles to achieve accurate and efficient AFM based nanomanipulation. AFM images are all contaminated by the thermal drift which often leads to failed manipulation operations. In this paper, a local scan strategy is applied to identify the thermal drift contamination in the AFM image and then the draft contamination is compensated. After an AFM image is captured, the entire image is divided into several strips along y direction. A local scan is immediately performed in each part of the image to determine the drift at that portion. In this manner, the drift value is calculated in a small local area instead of the global image. Thus, the drift can be more precisely estimated and the image can be more accurately recovered, and thus leading to improved accuracy of AFM image and enhanced efficiency in AFM based nanomanipulation. © 2008 IEEE.-
dc.languageeng-
dc.relation.ispartof2008 IEEE International Conference on Robotics and Biomimetics, ROBIO 2008-
dc.subjectNanomanipulation-
dc.subjectDrift compensation-
dc.subjectAtomic force microscope-
dc.titleCompensation of drift contamination in AFM image by local scan-
dc.typeConference_Paper-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1109/ROBIO.2009.4913051-
dc.identifier.scopuseid_2-s2.0-70349185071-
dc.identifier.spage487-
dc.identifier.epage492-

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