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Article: "Videolized" atomic force microscopy for interactive nanomanipulation and nanoassembly

Title"Videolized" atomic force microscopy for interactive nanomanipulation and nanoassembly
Authors
KeywordsHaptic feedback
Atomic force microscopy (AFM)
Augmented reality
Nanomanipulation
Issue Date2005
Citation
IEEE Transactions on Nanotechnology, 2005, v. 4, n. 5, p. 605-614 How to Cite?
AbstractThe main problem in nanomanipulation and nanoassembly using atomic force microscopy (AFM) is its lack of real-time visual feedback during manipulation. Fortunately, this problem has been solved by our recently developed augmented reality system, which includes real-time force feedback and real-time "videolized" visual feedback. Through the augmented reality interface, the operator can monitor real-time changes of the nanoenvironment during nanomanipulation through a movie-like AFM image. In this paper, the behavior of some nanowires under pushing is theoretically analyzed and the interaction among the tip, substrate, and nanowires has been modeled. Based on these models, the real-time interactive forces can be used to locally update the AFM image in order to obtain movie-like visual feedback in video frame rate. This augmented reality enhanced system capable of manipulation of nanoparticles and nanowires helps the operator to perform several operations without the need of a new image scan. AFM-based nanoassembly becomes feasible through this newly developed system. © 2005 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/212828
ISSN
2015 Impact Factor: 1.702
2015 SCImago Journal Rankings: 0.708

 

DC FieldValueLanguage
dc.contributor.authorLi, Guangyong-
dc.contributor.authorXi, Ning-
dc.contributor.authorChen, Heping-
dc.contributor.authorPomeroy, Craig-
dc.contributor.authorProkos, Mathew-
dc.date.accessioned2015-07-28T04:05:08Z-
dc.date.available2015-07-28T04:05:08Z-
dc.date.issued2005-
dc.identifier.citationIEEE Transactions on Nanotechnology, 2005, v. 4, n. 5, p. 605-614-
dc.identifier.issn1536-125X-
dc.identifier.urihttp://hdl.handle.net/10722/212828-
dc.description.abstractThe main problem in nanomanipulation and nanoassembly using atomic force microscopy (AFM) is its lack of real-time visual feedback during manipulation. Fortunately, this problem has been solved by our recently developed augmented reality system, which includes real-time force feedback and real-time "videolized" visual feedback. Through the augmented reality interface, the operator can monitor real-time changes of the nanoenvironment during nanomanipulation through a movie-like AFM image. In this paper, the behavior of some nanowires under pushing is theoretically analyzed and the interaction among the tip, substrate, and nanowires has been modeled. Based on these models, the real-time interactive forces can be used to locally update the AFM image in order to obtain movie-like visual feedback in video frame rate. This augmented reality enhanced system capable of manipulation of nanoparticles and nanowires helps the operator to perform several operations without the need of a new image scan. AFM-based nanoassembly becomes feasible through this newly developed system. © 2005 IEEE.-
dc.languageeng-
dc.relation.ispartofIEEE Transactions on Nanotechnology-
dc.subjectHaptic feedback-
dc.subjectAtomic force microscopy (AFM)-
dc.subjectAugmented reality-
dc.subjectNanomanipulation-
dc.title"Videolized" atomic force microscopy for interactive nanomanipulation and nanoassembly-
dc.typeArticle-
dc.description.natureLink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TNANO.2005.851430-
dc.identifier.scopuseid_2-s2.0-26644457200-
dc.identifier.volume4-
dc.identifier.issue5-
dc.identifier.spage605-
dc.identifier.epage614-

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