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Article: Line and Point Defects in MoSe2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy

TitleLine and Point Defects in MoSe2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy
Authors
Issue Date2015
PublisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/journals/ancac3/index.html
Citation
ACS Nano, 2015, v. 9 n. 6, p. 6619-6625 How to Cite?
AbstractBilayer (BL) MoSe2 films grown by molecular-beam epitaxy (MBE) are studied by scanning tunneling microscopy and spectroscopy (STM/S). Similar to monolayer (ML) films, networks of inversion domain boundary (DB) defects are observed both in the top and bottom layers of BL MoSe2, and often they are seen spatially correlated such that one is on top of the other. There are also isolated ones in the bottom layer without companion in the top-layer and are detected by STM/S through quantum tunneling of the defect states through the barrier of the MoSe2 ML. Comparing the DB states in BL MoSe2 with that of ML film reveals some common features as well as differences. Quantum confinement of the defect states is indicated. Point defects in BL MoSe2 are also observed by STM/S, where ionization of the donor defect by the tip-induced electric field is evidenced. These results are of great fundamental interests as well as practical relevance of devices made of MoSe2 ultrathin layers.
Persistent Identifierhttp://hdl.handle.net/10722/211906
ISSN
2015 Impact Factor: 13.334
2015 SCImago Journal Rankings: 7.120

 

DC FieldValueLanguage
dc.contributor.authorLiu, H-
dc.contributor.authorZheng, H-
dc.contributor.authorYang, F-
dc.contributor.authorJiao, L-
dc.contributor.authorChen, J-
dc.contributor.authorHo, WK-
dc.contributor.authorGao, C-
dc.contributor.authorJia, J-
dc.contributor.authorXie, MH-
dc.date.accessioned2015-07-21T02:15:36Z-
dc.date.available2015-07-21T02:15:36Z-
dc.date.issued2015-
dc.identifier.citationACS Nano, 2015, v. 9 n. 6, p. 6619-6625-
dc.identifier.issn1936-0851-
dc.identifier.urihttp://hdl.handle.net/10722/211906-
dc.description.abstractBilayer (BL) MoSe2 films grown by molecular-beam epitaxy (MBE) are studied by scanning tunneling microscopy and spectroscopy (STM/S). Similar to monolayer (ML) films, networks of inversion domain boundary (DB) defects are observed both in the top and bottom layers of BL MoSe2, and often they are seen spatially correlated such that one is on top of the other. There are also isolated ones in the bottom layer without companion in the top-layer and are detected by STM/S through quantum tunneling of the defect states through the barrier of the MoSe2 ML. Comparing the DB states in BL MoSe2 with that of ML film reveals some common features as well as differences. Quantum confinement of the defect states is indicated. Point defects in BL MoSe2 are also observed by STM/S, where ionization of the donor defect by the tip-induced electric field is evidenced. These results are of great fundamental interests as well as practical relevance of devices made of MoSe2 ultrathin layers.-
dc.languageeng-
dc.publisherAmerican Chemical Society. The Journal's web site is located at http://pubs.acs.org/journals/ancac3/index.html-
dc.relation.ispartofACS Nano-
dc.titleLine and Point Defects in MoSe2 Bilayer Studied by Scanning Tunneling Microscopy and Spectroscopy -
dc.typeArticle-
dc.identifier.emailLiu, H: liuhenry@hku.hk-
dc.identifier.emailHo, WK: howk@hku.hk-
dc.identifier.emailXie, MH: mhxie@hku.hk-
dc.identifier.authorityXie, MH=rp00818-
dc.identifier.doi10.1021/acsnano.5b02789-
dc.identifier.hkuros244443-
dc.identifier.volume9-
dc.identifier.issue6-
dc.identifier.spage6619-
dc.identifier.epage6625-
dc.publisher.placeUnited States-

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