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Article: Transient Mitigation of DC–DC Converters for High Output Current Slew Rate Applications

TitleTransient Mitigation of DC–DC Converters for High Output Current Slew Rate Applications
Authors
Issue Date2013
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=63
Citation
IEEE Transactions on Power Electronics , 2013, v. 28 n. 5, p. 2377-2388 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/196282
ISSN
2015 Impact Factor: 4.953
2015 SCImago Journal Rankings: 3.005
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorShan, ZYen_US
dc.contributor.authorTan, SCen_US
dc.contributor.authorTse, CKen_US
dc.date.accessioned2014-04-01T08:45:08Z-
dc.date.available2014-04-01T08:45:08Z-
dc.date.issued2013en_US
dc.identifier.citationIEEE Transactions on Power Electronics , 2013, v. 28 n. 5, p. 2377-2388en_US
dc.identifier.issn0885-8993-
dc.identifier.urihttp://hdl.handle.net/10722/196282-
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=63-
dc.relation.ispartofIEEE Transactions on Power Electronicsen_US
dc.rightsIEEE Transactions on Power Electronics . Copyright © Institute of Electrical and Electronics Engineers.-
dc.rights©2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.titleTransient Mitigation of DC–DC Converters for High Output Current Slew Rate Applicationsen_US
dc.typeArticleen_US
dc.identifier.emailTan, SC: sctan@eee.hku.hken_US
dc.identifier.authorityTan, SC=rp01606en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/TPEL.2012.2212031en_US
dc.identifier.scopuseid_2-s2.0-84870509419-
dc.identifier.hkuros228387en_US
dc.identifier.volume28en_US
dc.identifier.issue5-
dc.identifier.spage2377en_US
dc.identifier.epage2388en_US
dc.identifier.isiWOS:000314699700026-
dc.publisher.placeUnited States-

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