File Download
  Links for fulltext
     (May Require Subscription)

Conference Paper: IClass assessment: a pen-based assessment and feedback platform

TitleIClass assessment: a pen-based assessment and feedback platform
Authors
KeywordsCloud-based Learning and Assessment
Future Classroom
Learning Analystics
School of the Future
Issue Date2013
PublisherIEEE Computer Society. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000009
Citation
The IEEE 13th International Conference on Advanced Learning Technologies (ICALT 2013), Beijing, China, 15-18 July 2013. In Conference Proceedings, 2013, p. 467-468 How to Cite?
AbstractIn recent years, the demand of in-class interaction and assessment for learning is rising. There is more emphasis on using electronic tools for assessment for learning in order to facilitate teachers seeking to identify and diagnose student learning problems, and providing quality feedback for students on how to improve their work. This paper discusses the challenges of e-assessment and introduced a pen-based assessment and feedback platform developed in Hong Kong. The platform can provide an efficient and effective channel for providing feedback so as to monitor any learning difficulties and help teachers to diagnose students' prior skills and abilities, providing feedback for them to adjust the curriculum or provide additional assistance accordingly. © 2013 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/189900
ISBN
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorFok, WWTen_US
dc.contributor.authorChan, CKYen_US
dc.date.accessioned2013-09-17T15:01:10Z-
dc.date.available2013-09-17T15:01:10Z-
dc.date.issued2013en_US
dc.identifier.citationThe IEEE 13th International Conference on Advanced Learning Technologies (ICALT 2013), Beijing, China, 15-18 July 2013. In Conference Proceedings, 2013, p. 467-468en_US
dc.identifier.isbn978-0-7695-5009-1-
dc.identifier.urihttp://hdl.handle.net/10722/189900-
dc.description.abstractIn recent years, the demand of in-class interaction and assessment for learning is rising. There is more emphasis on using electronic tools for assessment for learning in order to facilitate teachers seeking to identify and diagnose student learning problems, and providing quality feedback for students on how to improve their work. This paper discusses the challenges of e-assessment and introduced a pen-based assessment and feedback platform developed in Hong Kong. The platform can provide an efficient and effective channel for providing feedback so as to monitor any learning difficulties and help teachers to diagnose students' prior skills and abilities, providing feedback for them to adjust the curriculum or provide additional assistance accordingly. © 2013 IEEE.-
dc.languageengen_US
dc.publisherIEEE Computer Society. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1000009en_US
dc.relation.ispartofInternational Conference on Advanced Learning Technologies (IWALT) Proceedingsen_US
dc.rightsCreative Commons: Attribution 3.0 Hong Kong Licenseen_US
dc.rights©2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.subjectCloud-based Learning and Assessment-
dc.subjectFuture Classroom-
dc.subjectLearning Analystics-
dc.subjectSchool of the Future-
dc.titleIClass assessment: a pen-based assessment and feedback platformen_US
dc.typeConference_Paperen_US
dc.identifier.emailFok, WWT: wilton@hkucc.hku.hken_US
dc.identifier.emailChan, CKY: cecilia.chan@caut.hku.hken_US
dc.identifier.authorityFok, WWT=rp00116en_US
dc.identifier.authorityChan, CKY=rp00892en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/ICALT.2013.179-
dc.identifier.scopuseid_2-s2.0-84885224328-
dc.identifier.hkuros224167en_US
dc.identifier.spage467-
dc.identifier.epage468-
dc.identifier.isiWOS:000333902700138-
dc.publisher.placeUnited Statesen_US
dc.customcontrol.immutablesml 131101-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats