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Conference Paper: New impulse (noncausality) test for descriptor systems by Möbius transformation

TitleNew impulse (noncausality) test for descriptor systems by Möbius transformation
Authors
KeywordsCausality
Descriptor system (DS)
Impulse
Linear time invariant (LTI) system
Mȯbius transformation (MT)
Issue Date2012
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at https://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001331
Citation
The 31st Chinese Control Conference (CCC 2012), Hefei, China, 25-27 July 2012. In Proceedings of the 31st Chinese Control Conference, 2012, p. 2759-2764 How to Cite?
AbstractDescriptor systems (DSs) are usually used to model very-large-scale integration (VLSI) circuit systems and multibody dynamics macromodeling. The analysis of DSs, however, is much more complicated than linear time-invariant (LTI) systems due to the poles at infinity. Mȯbius transformation (MT) provides a way to transform poles at infinity to finite poles and largely facilitates the reuse or adaptation of the standard techniques for LTI system to analyze DSs. Nonetheless, MT is well known in the literature and its potential use is currently less appreciated in the analysis of DSs. This paper gives a new way to the impulse (noncausality) test using the properties of the transformed LTI systems by MT. Moreover, the applications to the analysis of controllability, observability and regularity are given. Numerical examples are included to show the effectiveness of the proposed method. © 2012 Chinese Assoc of Automati.
Persistent Identifierhttp://hdl.handle.net/10722/186786
ISBN
ISSN
2020 SCImago Journal Rankings: 0.152
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWang, Qen_US
dc.contributor.authorLam, EYen_US
dc.contributor.authorWong, Nen_US
dc.date.accessioned2013-08-20T12:19:31Z-
dc.date.available2013-08-20T12:19:31Z-
dc.date.issued2012en_US
dc.identifier.citationThe 31st Chinese Control Conference (CCC 2012), Hefei, China, 25-27 July 2012. In Proceedings of the 31st Chinese Control Conference, 2012, p. 2759-2764en_US
dc.identifier.isbn978-988156381-1-
dc.identifier.issn1934-1768-
dc.identifier.urihttp://hdl.handle.net/10722/186786-
dc.description.abstractDescriptor systems (DSs) are usually used to model very-large-scale integration (VLSI) circuit systems and multibody dynamics macromodeling. The analysis of DSs, however, is much more complicated than linear time-invariant (LTI) systems due to the poles at infinity. Mȯbius transformation (MT) provides a way to transform poles at infinity to finite poles and largely facilitates the reuse or adaptation of the standard techniques for LTI system to analyze DSs. Nonetheless, MT is well known in the literature and its potential use is currently less appreciated in the analysis of DSs. This paper gives a new way to the impulse (noncausality) test using the properties of the transformed LTI systems by MT. Moreover, the applications to the analysis of controllability, observability and regularity are given. Numerical examples are included to show the effectiveness of the proposed method. © 2012 Chinese Assoc of Automati.-
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at https://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001331-
dc.relation.ispartofProceedings of the 31st Chinese Control Conferenceen_US
dc.rightsProceedings of the 31st Chinese Control Conference. Copyright © Institute of Electrical and Electronics Engineers.-
dc.subjectCausality-
dc.subjectDescriptor system (DS)-
dc.subjectImpulse-
dc.subjectLinear time invariant (LTI) system-
dc.subjectMȯbius transformation (MT)-
dc.titleNew impulse (noncausality) test for descriptor systems by Möbius transformationen_US
dc.typeConference_Paperen_US
dc.identifier.emailWang, Q: wangqing@hku.hken_US
dc.identifier.emailLam, EY: elam@eee.hku.hken_US
dc.identifier.emailWong, N: nwong@eee.hku.hken_US
dc.identifier.authorityLam, EY=rp00131en_US
dc.identifier.authorityWong, N=rp00190en_US
dc.identifier.scopuseid_2-s2.0-84873553081-
dc.identifier.hkuros220491en_US
dc.identifier.hkuros222403-
dc.identifier.spage2759-
dc.identifier.epage2764-
dc.identifier.isiWOS:000393905902160-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 130904-
dc.identifier.issnl1934-1768-

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