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Conference Paper: New impulse (noncausality) test for descriptor systems by Mobius-transformation

TitleNew impulse (noncausality) test for descriptor systems by Mobius-transformation
Authors
KeywordsCausality
Descriptor system (DS)
Impulse
Linear time invariant (LTI) system
Mȯbius transformation (MT)
Issue Date2012
PublisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001331
Citation
The 31st Chinese Control Conference (CCC 2012), Hefei, China, 25-27 July 2012. In Chinese Control Conference, 2012, p. 2759-2764 How to Cite?
AbstractDescriptor systems (DSs) are usually used to model very-large-scale integration (VLSI) circuit systems and multibody dynamics macromodeling. The analysis of DSs, however, is much more complicated than linear time-invariant (LTI) systems due to the poles at infinity. Mȯbius transformation (MT) provides a way to transform poles at infinity to finite poles and largely facilitates the reuse or adaptation of the standard techniques for LTI system to analyze DSs. Nonetheless, MT is well known in the literature and its potential use is currently less appreciated in the analysis of DSs. This paper gives a new way to the impulse (noncausality) test using the properties of the transformed LTI systems by MT. Moreover, the applications to the analysis of controllability, observability and regularity are given. Numerical examples are included to show the effectiveness of the proposed method. © 2012 Chinese Assoc of Automati.
Persistent Identifierhttp://hdl.handle.net/10722/186786
ISBN
ISSN

 

DC FieldValueLanguage
dc.contributor.authorWang, Qen_US
dc.contributor.authorLam, EYen_US
dc.contributor.authorWong, Nen_US
dc.date.accessioned2013-08-20T12:19:31Z-
dc.date.available2013-08-20T12:19:31Z-
dc.date.issued2012en_US
dc.identifier.citationThe 31st Chinese Control Conference (CCC 2012), Hefei, China, 25-27 July 2012. In Chinese Control Conference, 2012, p. 2759-2764en_US
dc.identifier.isbn978-988156381-1-
dc.identifier.issn1934-1768-
dc.identifier.urihttp://hdl.handle.net/10722/186786-
dc.description.abstractDescriptor systems (DSs) are usually used to model very-large-scale integration (VLSI) circuit systems and multibody dynamics macromodeling. The analysis of DSs, however, is much more complicated than linear time-invariant (LTI) systems due to the poles at infinity. Mȯbius transformation (MT) provides a way to transform poles at infinity to finite poles and largely facilitates the reuse or adaptation of the standard techniques for LTI system to analyze DSs. Nonetheless, MT is well known in the literature and its potential use is currently less appreciated in the analysis of DSs. This paper gives a new way to the impulse (noncausality) test using the properties of the transformed LTI systems by MT. Moreover, the applications to the analysis of controllability, observability and regularity are given. Numerical examples are included to show the effectiveness of the proposed method. © 2012 Chinese Assoc of Automati.-
dc.languageengen_US
dc.publisherInstitute of Electrical and Electronics Engineers. The Journal's web site is located at http://www.ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1001331-
dc.relation.ispartofChinese Control Conferenceen_US
dc.rightsChinese Control Conference. Copyright © Institute of Electrical and Electronics Engineers.-
dc.rights©2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.subjectCausality-
dc.subjectDescriptor system (DS)-
dc.subjectImpulse-
dc.subjectLinear time invariant (LTI) system-
dc.subjectMȯbius transformation (MT)-
dc.titleNew impulse (noncausality) test for descriptor systems by Mobius-transformationen_US
dc.typeConference_Paperen_US
dc.identifier.emailWang, Q: wangqing@hku.hken_US
dc.identifier.emailLam, EY: elam@eee.hku.hken_US
dc.identifier.emailWong, N: nwong@eee.hku.hken_US
dc.identifier.authorityLam, EY=rp00131en_US
dc.identifier.authorityWong, N=rp00190en_US
dc.description.naturepublished_or_final_version-
dc.identifier.scopuseid_2-s2.0-84873553081-
dc.identifier.hkuros220491en_US
dc.identifier.hkuros222403-
dc.identifier.spage2759-
dc.identifier.epage2764-
dc.publisher.placeUnited States-
dc.customcontrol.immutablesml 130904-

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