File Download
  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Source Reconstruction Method Based Radiated Emission Characterization for PCBs

TitleSource Reconstruction Method Based Radiated Emission Characterization for PCBs
Authors
Issue Date2013
Citation
IEEE Transactions on Electron Devices, 2013, v. 55 n. 5, p. 933-940 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/185853
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorLI, Pen_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2013-08-20T11:44:01Z-
dc.date.available2013-08-20T11:44:01Z-
dc.date.issued2013-
dc.identifier.citationIEEE Transactions on Electron Devices, 2013, v. 55 n. 5, p. 933-940en_US
dc.identifier.urihttp://hdl.handle.net/10722/185853-
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Electron Devicesen_US
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rights©2013 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.titleSource Reconstruction Method Based Radiated Emission Characterization for PCBsen_US
dc.typeArticleen_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/TEMC.2012.2235837-
dc.identifier.hkuros218836en_US
dc.identifier.isiWOS:000325848700016-

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats