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Article: Integration of arbitrary lumped multiport circuit networks into the discontinuous galerkin time-domain analysis

TitleIntegration of arbitrary lumped multiport circuit networks into the discontinuous galerkin time-domain analysis
Authors
Li, PJiang, L
KeywordsCircuit network parameters
Discontinuous Galerkin time-domain (DGTD) method
Fast-relaxation vector-fitting (FRVF) method
Local time-stepping (LTS) method
Multiport lumped-circuit networks
Transient analysis
Issue Date2013
PublisherIEEE.
Citation
IEEE Transactions on Microwave Theory and Techniques, 2013, v. 61 n. 7, p. 2525-2534 How to Cite?
DOI: http://dx.doi.org/10.1109/TMTT.2013.2261085
Persistent Identifierhttp://hdl.handle.net/10722/185851
ISSN
0018-9480
2021 Impact Factor: 4.381
2020 SCImago Journal Rankings: 1.372
ISI Accession Number ID
WOS:000321218300001

 

DC FieldValueLanguage
dc.contributor.authorLi, Pen_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2013-08-20T11:44:00Z-
dc.date.available2013-08-20T11:44:00Z-
dc.date.issued2013en_US
dc.identifier.citationIEEE Transactions on Microwave Theory and Techniques, 2013, v. 61 n. 7, p. 2525-2534en_US
dc.identifier.issn0018-9480-
dc.identifier.urihttp://hdl.handle.net/10722/185851-
dc.languageengen_US
dc.publisherIEEE.-
dc.relation.ispartofIEEE Transactions on Microwave Theory and Techniquesen_US
dc.subjectCircuit network parameters-
dc.subjectDiscontinuous Galerkin time-domain (DGTD) method-
dc.subjectFast-relaxation vector-fitting (FRVF) method-
dc.subjectLocal time-stepping (LTS) method-
dc.subjectMultiport lumped-circuit networks-
dc.subjectTransient analysis-
dc.titleIntegration of arbitrary lumped multiport circuit networks into the discontinuous galerkin time-domain analysisen_US
dc.typeArticleen_US
dc.identifier.emailJiang, L: jianglj@hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1109/TMTT.2013.2261085-
dc.identifier.scopuseid_2-s2.0-84896689680-
dc.identifier.hkuros218834en_US
dc.identifier.volume61en_US
dc.identifier.issue7-
dc.identifier.spage2525en_US
dc.identifier.epage2534en_US
dc.identifier.isiWOS:000321218300001-
dc.publisher.placeUnited States-
dc.identifier.issnl0018-9480-

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