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Article: Unified analysis of perfectly matched layers using differential forms

TitleUnified analysis of perfectly matched layers using differential forms
Authors
Teixeira, FLChew, WC
KeywordsElectromagnetic Wave Absorption
Electromagnetic Waves
Perfectly Matched Layer
Issue Date1999
PublisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176
Citation
Microwave And Optical Technology Letters, 1999, v. 20 n. 2, p. 124-126 How to Cite?
AbstractThe perfectly matched layer (PML) concept is interpreted as a change in the metric of space. By using the language of differential forms applied to the electromagnetic fields and exploring the metric invariance of Maxwell's equations, the various prevalent PML formulations (Maxwellian and non-Maxwellian) are unified. The analysis also reveals that other PML formulations are also possible, embodying the previous PML formulations as special cases. © 1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 124-126, 1999.
Persistent Identifierhttp://hdl.handle.net/10722/182612
ISSN
0895-2477
2021 Impact Factor: 1.311
2020 SCImago Journal Rankings: 0.304
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorTeixeira, FLen_US
dc.contributor.authorChew, WCen_US
dc.date.accessioned2013-05-02T05:16:07Z-
dc.date.available2013-05-02T05:16:07Z-
dc.date.issued1999en_US
dc.identifier.citationMicrowave And Optical Technology Letters, 1999, v. 20 n. 2, p. 124-126en_US
dc.identifier.issn0895-2477en_US
dc.identifier.urihttp://hdl.handle.net/10722/182612-
dc.description.abstractThe perfectly matched layer (PML) concept is interpreted as a change in the metric of space. By using the language of differential forms applied to the electromagnetic fields and exploring the metric invariance of Maxwell's equations, the various prevalent PML formulations (Maxwellian and non-Maxwellian) are unified. The analysis also reveals that other PML formulations are also possible, embodying the previous PML formulations as special cases. © 1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 20: 124-126, 1999.en_US
dc.languageengen_US
dc.publisherJohn Wiley & Sons, Inc. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/37176en_US
dc.relation.ispartofMicrowave and Optical Technology Lettersen_US
dc.subjectElectromagnetic Wave Absorptionen_US
dc.subjectElectromagnetic Wavesen_US
dc.subjectPerfectly Matched Layeren_US
dc.titleUnified analysis of perfectly matched layers using differential formsen_US
dc.typeArticleen_US
dc.identifier.emailChew, WC: wcchew@hku.hken_US
dc.identifier.authorityChew, WC=rp00656en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0032733386en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0032733386&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume20en_US
dc.identifier.issue2en_US
dc.identifier.spage124en_US
dc.identifier.epage126en_US
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridTeixeira, FL=7102746700en_US
dc.identifier.scopusauthoridChew, WC=36014436300en_US
dc.identifier.issnl0895-2477-

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