File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Small-cone method of directly forming atomic images from energy-dependent photoelectron-diffraction data

TitleSmall-cone method of directly forming atomic images from energy-dependent photoelectron-diffraction data
Authors
Issue Date1995
PublisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/
Citation
Physical Review B, 1995, v. 51 n. 20, p. 14549-14553 How to Cite?
AbstractThe method of inverting energy-dependent photoelectron-diffraction spectra collected at various emission angles to obtain images of individual atoms is applied to data for adsorbates on silicon. Since the results show considerable artifacts, an analysis of the procedure is done, which leads to a method that is model independent and relies only on the measured spectra. The result shows clean images and dimensional accuracy to about 0.2. For any given point R in space, the method inverts spectra within a small cone whose axis is -R. The method is based on the experimentally determined phase and magnitude of the field generated by inversion of spectra. © 1995 The American Physical Society.
Persistent Identifierhttp://hdl.handle.net/10722/175016
ISSN
2001 Impact Factor: 3.07
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorWu, Hen_US
dc.contributor.authorLapeyre, GJen_US
dc.date.accessioned2012-11-26T08:48:47Z-
dc.date.available2012-11-26T08:48:47Z-
dc.date.issued1995en_US
dc.identifier.citationPhysical Review B, 1995, v. 51 n. 20, p. 14549-14553en_US
dc.identifier.issn0163-1829en_US
dc.identifier.urihttp://hdl.handle.net/10722/175016-
dc.description.abstractThe method of inverting energy-dependent photoelectron-diffraction spectra collected at various emission angles to obtain images of individual atoms is applied to data for adsorbates on silicon. Since the results show considerable artifacts, an analysis of the procedure is done, which leads to a method that is model independent and relies only on the measured spectra. The result shows clean images and dimensional accuracy to about 0.2. For any given point R in space, the method inverts spectra within a small cone whose axis is -R. The method is based on the experimentally determined phase and magnitude of the field generated by inversion of spectra. © 1995 The American Physical Society.en_US
dc.languageengen_US
dc.publisherAmerican Physical Society. The Journal's web site is located at http://prb.aps.org/en_US
dc.relation.ispartofPhysical Review Ben_US
dc.titleSmall-cone method of directly forming atomic images from energy-dependent photoelectron-diffraction dataen_US
dc.typeArticleen_US
dc.identifier.emailWu, H: hswu@hkucc.hku.hken_US
dc.identifier.authorityWu, H=rp00813en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1103/PhysRevB.51.14549en_US
dc.identifier.scopuseid_2-s2.0-33744622162en_US
dc.identifier.volume51en_US
dc.identifier.issue20en_US
dc.identifier.spage14549en_US
dc.identifier.epage14553en_US
dc.identifier.isiWOS:A1995RB21300071-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridWu, H=7405584367en_US
dc.identifier.scopusauthoridLapeyre, GJ=35515323300en_US

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats