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Article: Study of the C 2H 4/Si(100)-(2 × 1) interface by derivative photoelectron holography

TitleStudy of the C 2H 4/Si(100)-(2 × 1) interface by derivative photoelectron holography
Authors
KeywordsPhotoelectron Holography
Surface Structure
Issue Date2003
PublisherWorld Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/srl/srl.shtml
Citation
Surface Review And Letters, 2003, v. 10 n. 6, p. 925-932 How to Cite?
AbstractThe k derivative spectra (KDS) transform is used for construction of the three-dimensional atomic structure of the C 2H 4/Si(100)-(2 × 1) system from photoelectron diffraction data. The image function obtained by the KDS transform clearly observes the second-layer Si atoms and the C emitters apart from the first-layer Si atoms. The observations of the second-layer Si atoms and the C emitters make it easy to measure the C-C bond length correctly. Then a conclusive adsorption model - the di-σ model - for the C 2H 4/Si(100)-(2 × 1) system is established. In comparison with the KDS transform, the normal small-cone transform hardly measures the C-C bond length. The ability to observe more scatterers of a photoelectron emitter by the KDS transform expands the applicability of holographic imaging.
Persistent Identifierhttp://hdl.handle.net/10722/174929
ISSN
2015 Impact Factor: 0.435
2015 SCImago Journal Rankings: 0.156
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorXu, SHen_US
dc.contributor.authorWu, HSen_US
dc.contributor.authorTong, SYen_US
dc.contributor.authorKeeffe, Men_US
dc.contributor.authorLapeyre, GJen_US
dc.contributor.authorRotenberg, Een_US
dc.date.accessioned2012-11-26T08:48:12Z-
dc.date.available2012-11-26T08:48:12Z-
dc.date.issued2003en_US
dc.identifier.citationSurface Review And Letters, 2003, v. 10 n. 6, p. 925-932en_US
dc.identifier.issn0218-625Xen_US
dc.identifier.urihttp://hdl.handle.net/10722/174929-
dc.description.abstractThe k derivative spectra (KDS) transform is used for construction of the three-dimensional atomic structure of the C 2H 4/Si(100)-(2 × 1) system from photoelectron diffraction data. The image function obtained by the KDS transform clearly observes the second-layer Si atoms and the C emitters apart from the first-layer Si atoms. The observations of the second-layer Si atoms and the C emitters make it easy to measure the C-C bond length correctly. Then a conclusive adsorption model - the di-σ model - for the C 2H 4/Si(100)-(2 × 1) system is established. In comparison with the KDS transform, the normal small-cone transform hardly measures the C-C bond length. The ability to observe more scatterers of a photoelectron emitter by the KDS transform expands the applicability of holographic imaging.en_US
dc.languageengen_US
dc.publisherWorld Scientific Publishing Co Pte Ltd. The Journal's web site is located at http://www.worldscinet.com/srl/srl.shtmlen_US
dc.relation.ispartofSurface Review and Lettersen_US
dc.subjectPhotoelectron Holographyen_US
dc.subjectSurface Structureen_US
dc.titleStudy of the C 2H 4/Si(100)-(2 × 1) interface by derivative photoelectron holographyen_US
dc.typeArticleen_US
dc.identifier.emailWu, HS: hswu@hkucc.hku.hken_US
dc.identifier.authorityWu, HS=rp00813en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1142/S0218625X03005670en_US
dc.identifier.scopuseid_2-s2.0-1542410408en_US
dc.identifier.hkuros88428-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-1542410408&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume10en_US
dc.identifier.issue6en_US
dc.identifier.spage925en_US
dc.identifier.epage932en_US
dc.identifier.isiWOS:000220312100013-
dc.publisher.placeSingaporeen_US
dc.identifier.scopusauthoridXu, SH=36832008600en_US
dc.identifier.scopusauthoridWu, HS=7405584367en_US
dc.identifier.scopusauthoridTong, SY=24512624800en_US
dc.identifier.scopusauthoridKeeffe, M=6507187080en_US
dc.identifier.scopusauthoridLapeyre, GJ=35515323300en_US
dc.identifier.scopusauthoridRotenberg, E=7006230675en_US

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