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Article: Correlated flux creep through columnar defects in YBa2Cu3O7 crystals

TitleCorrelated flux creep through columnar defects in YBa2Cu3O7 crystals
Authors
Issue Date1993
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/ssc
Citation
Solid State Communications, 1993, v. 87 n. 2, p. 93-94 How to Cite?
AbstractSome recent flux creep experiments performed on YBa2Cu3O7 crystals with columnar defects can be explained by the correlated creep formula developed by Chau and Cheng. The tension and pinning energies deduced are compared with their corresponding theoretical values, suggesting that flux lines are strongly pinned to the columnar defects. © 1993.
Persistent Identifierhttp://hdl.handle.net/10722/174700
ISSN
2015 Impact Factor: 1.458
2015 SCImago Journal Rankings: 0.776

 

DC FieldValueLanguage
dc.contributor.authorChau, HFen_US
dc.date.accessioned2012-11-26T08:46:56Z-
dc.date.available2012-11-26T08:46:56Z-
dc.date.issued1993en_US
dc.identifier.citationSolid State Communications, 1993, v. 87 n. 2, p. 93-94en_US
dc.identifier.issn0038-1098en_US
dc.identifier.urihttp://hdl.handle.net/10722/174700-
dc.description.abstractSome recent flux creep experiments performed on YBa2Cu3O7 crystals with columnar defects can be explained by the correlated creep formula developed by Chau and Cheng. The tension and pinning energies deduced are compared with their corresponding theoretical values, suggesting that flux lines are strongly pinned to the columnar defects. © 1993.en_US
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/sscen_US
dc.relation.ispartofSolid State Communicationsen_US
dc.titleCorrelated flux creep through columnar defects in YBa2Cu3O7 crystalsen_US
dc.typeArticleen_US
dc.identifier.emailChau, HF: hfchau@hku.hken_US
dc.identifier.authorityChau, HF=rp00669en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0027625788en_US
dc.identifier.volume87en_US
dc.identifier.issue2en_US
dc.identifier.spage93en_US
dc.identifier.epage94en_US
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridChau, HF=7005742276en_US

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