File Download

There are no files associated with this item.

  Links for fulltext
     (May Require Subscription)
Supplementary

Article: Laser ablation sampling with inductively coupled plasma atomic emission spectrometry for the analysis of prototypical glasses

TitleLaser ablation sampling with inductively coupled plasma atomic emission spectrometry for the analysis of prototypical glasses
Authors
KeywordsDirect Solid Sampling
Glasses
Inductively Coupled Plasma Atomic Emission Spectrometry
Laser Ablation
Preferential Vaporization
Issue Date1995
PublisherRoyal Society of Chemistry. The Journal's web site is located at http://www.rsc.org/jaas
Citation
Journal Of Analytical Atomic Spectrometry, 1995, v. 10 n. 4, p. 295-301 How to Cite?
AbstractLaser ablation sampling is presented as an alternative to dissolution procedures for elemental analyses of prototypical glasses using inductively coupled plasma atomic emission spectrometry. These glass samples were prototypes of vitrified waste products from the Savannah River Technology Center. The samples were not translated or rotated during laser sampling, but were repetitively sampled at a single spot using a KrF excimer laser with a 10 Hz repetition rate. The time-dependent mass ablation rate was measured and is discussed. Silicon, the major element in the matrix, was used as an internal standard, and excellent precision (sr = 1-3%) was obtained. Quantitative analysis was demonstrated using known prototypical glass compositions. Preferential vaporization was investigated by comparing measured elemental ratios using a nanosecond excimer laser (λ = 248 nm) and a picosecond Nd: YAG laser (fourth harmonic, λ = 266 nm).
Persistent Identifierhttp://hdl.handle.net/10722/167540
ISSN
2015 Impact Factor: 3.379
2015 SCImago Journal Rankings: 1.022
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorRusso, REen_US
dc.contributor.authorMao, XLen_US
dc.contributor.authorChan, WTen_US
dc.contributor.authorBryant, MFen_US
dc.contributor.authorKinard, WFen_US
dc.date.accessioned2012-10-08T03:08:14Z-
dc.date.available2012-10-08T03:08:14Z-
dc.date.issued1995en_US
dc.identifier.citationJournal Of Analytical Atomic Spectrometry, 1995, v. 10 n. 4, p. 295-301en_US
dc.identifier.issn0267-9477en_US
dc.identifier.urihttp://hdl.handle.net/10722/167540-
dc.description.abstractLaser ablation sampling is presented as an alternative to dissolution procedures for elemental analyses of prototypical glasses using inductively coupled plasma atomic emission spectrometry. These glass samples were prototypes of vitrified waste products from the Savannah River Technology Center. The samples were not translated or rotated during laser sampling, but were repetitively sampled at a single spot using a KrF excimer laser with a 10 Hz repetition rate. The time-dependent mass ablation rate was measured and is discussed. Silicon, the major element in the matrix, was used as an internal standard, and excellent precision (sr = 1-3%) was obtained. Quantitative analysis was demonstrated using known prototypical glass compositions. Preferential vaporization was investigated by comparing measured elemental ratios using a nanosecond excimer laser (λ = 248 nm) and a picosecond Nd: YAG laser (fourth harmonic, λ = 266 nm).en_US
dc.languageengen_US
dc.publisherRoyal Society of Chemistry. The Journal's web site is located at http://www.rsc.org/jaasen_US
dc.relation.ispartofJournal of Analytical Atomic Spectrometryen_US
dc.subjectDirect Solid Samplingen_US
dc.subjectGlassesen_US
dc.subjectInductively Coupled Plasma Atomic Emission Spectrometryen_US
dc.subjectLaser Ablationen_US
dc.subjectPreferential Vaporizationen_US
dc.titleLaser ablation sampling with inductively coupled plasma atomic emission spectrometry for the analysis of prototypical glassesen_US
dc.typeArticleen_US
dc.identifier.emailChan, WT:wtchan@hku.hken_US
dc.identifier.authorityChan, WT=rp00668en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1039/JA9951000295-
dc.identifier.scopuseid_2-s2.0-0029291062en_US
dc.identifier.hkuros1009-
dc.identifier.volume10en_US
dc.identifier.issue4en_US
dc.identifier.spage295en_US
dc.identifier.epage301en_US
dc.identifier.isiWOS:A1995QU59500001-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridRusso, RE=7201443495en_US
dc.identifier.scopusauthoridMao, XL=7402841260en_US
dc.identifier.scopusauthoridChan, WT=7403918827en_US
dc.identifier.scopusauthoridBryant, MF=7202678158en_US
dc.identifier.scopusauthoridKinard, WF=6701689043en_US

Export via OAI-PMH Interface in XML Formats


OR


Export to Other Non-XML Formats