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Article: Modelling the strongest grain size in nanocrystalline FCC metals

TitleModelling the strongest grain size in nanocrystalline FCC metals
Authors
KeywordsAbnormal Hall-Petch
Nanocrystalline
Strength
Issue Date2011
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/matlet
Citation
Materials Letters, 2011, v. 65 n. 19-20, p. 3128-3130 How to Cite?
AbstractA physical model is proposed to predict the critical grain size at which nanocrystalline FCC metals reach a maximum steady state flow stress. The model considers that nanocrystalline metals are composed of two phases. One is the grain boundary phase and the other is the grain interior phase. The grain boundary phase has specific deformation mechanism different to the grain interior phase. The critical grain size with the maximum steady state flow stress is predicted to decrease with deformation temperature and to increase with strain rate. Both normal and abnormal Hall-Petch relations can be described simultaneously by the model. © 2011 Elsevier B.V. All Rights Reserved.
Persistent Identifierhttp://hdl.handle.net/10722/137362
ISSN
2021 Impact Factor: 3.574
2020 SCImago Journal Rankings: 0.755
ISI Accession Number ID
Funding AgencyGrant Number
University Research Committee of The University of Hong Kong201009159012
Funding Information:

MH gratefully acknowledges the financial support from the University Research Committee of The University of Hong Kong (Project code: 201009159012).

References
Grants

 

DC FieldValueLanguage
dc.contributor.authorHuang, Men_HK
dc.contributor.authorBouaziz, Oen_HK
dc.contributor.authorDer Zwaag, SVen_HK
dc.date.accessioned2011-08-26T14:23:40Z-
dc.date.available2011-08-26T14:23:40Z-
dc.date.issued2011en_HK
dc.identifier.citationMaterials Letters, 2011, v. 65 n. 19-20, p. 3128-3130en_HK
dc.identifier.issn0167-577Xen_HK
dc.identifier.urihttp://hdl.handle.net/10722/137362-
dc.description.abstractA physical model is proposed to predict the critical grain size at which nanocrystalline FCC metals reach a maximum steady state flow stress. The model considers that nanocrystalline metals are composed of two phases. One is the grain boundary phase and the other is the grain interior phase. The grain boundary phase has specific deformation mechanism different to the grain interior phase. The critical grain size with the maximum steady state flow stress is predicted to decrease with deformation temperature and to increase with strain rate. Both normal and abnormal Hall-Petch relations can be described simultaneously by the model. © 2011 Elsevier B.V. All Rights Reserved.en_HK
dc.languageengen_US
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/matleten_HK
dc.relation.ispartofMaterials Lettersen_HK
dc.subjectAbnormal Hall-Petchen_HK
dc.subjectNanocrystallineen_HK
dc.subjectStrengthen_HK
dc.titleModelling the strongest grain size in nanocrystalline FCC metalsen_HK
dc.typeArticleen_HK
dc.identifier.openurlhttp://library.hku.hk:4550/resserv?sid=HKU:IR&issn=0167-577X&volume=65&issue=19-20&spage=3128&epage=3130&date=2011&atitle=Modelling+the+strongest+grain+size+in+nanocrystalline+FCC+metals-
dc.identifier.emailHuang, M:mxhuang@hku.hken_HK
dc.identifier.authorityHuang, M=rp01418en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.matlet.2011.06.104en_HK
dc.identifier.scopuseid_2-s2.0-79960501943en_HK
dc.identifier.hkuros192008en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79960501943&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume65en_HK
dc.identifier.issue19-20en_HK
dc.identifier.spage3128en_HK
dc.identifier.epage3130en_HK
dc.identifier.isiWOS:000295068300080-
dc.publisher.placeNetherlandsen_HK
dc.relation.projectThe nucleation mechanism of nano-sized twins in Twinning Induced Plasticity (TWIP) steels-
dc.identifier.scopusauthoridHuang, M=23469788700en_HK
dc.identifier.scopusauthoridBouaziz, O=6602183179en_HK
dc.identifier.scopusauthoridDer Zwaag, SV=43460983500en_HK
dc.identifier.citeulike9528487-
dc.identifier.issnl0167-577X-

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