Export Records
Step 1: Select material type
    Step 2: Select content and export format
    • Citation only
    • Citation + Fulltext [Email Only]
    Step 3: Select export method
    • Download
    • Email
    • Select a material type, please.
    • You must login to use email export.
    Close
    We build the publications from HKU and external sources automatically. If you do not see your publications here, please note:
    • We receive data from HKU's Research Output System (ROS), after you or your people enter data there. If you have entered, or are going to enter data into ROS, we do not want to enter them manually into the Hub, as it will create duplicates. When entering data into ROS, please remember to include the DOI or ISBN. It will help us match on outside sources, and dedup.
    • If you are NOT going to enter publication data into ROS, or if you have publications from before your time at HKU, please put them into an EndNote file and send to us, hub@lib.hku.hk. It will allow us to enter in batch. HKU has a site license for EndNote. You may google for "endnote@hk". HKU Libraries can instruct on Endnote, either in class or one on one, http://lib.hku.hk/general/help.html
    • You may log into your ResearcherPage with your HKU Portal, and use the "Manage Publications" entry on the green left side menu, to unlink publications from your ResearcherPage, or, select a few to appear in a new box, "Selected Publications".
    • Confused? Please write to hub@lib.hku.hk.
    HKU ResearcherPage: Fung, SHY
     
    rp00695.jpg picture
    Professor Fung, Stevenson Hon Yuen
    馮漢源
    Title
    • Professor
    Dept:
    Faculty:
    Publication list (Conference Papers)
    Results 1-20 of 67
    Result pages: 1
    TypeTitleAuthor(s)YearViews
    Temperature dependence of resistive switching in aluminum/anodized aluminum film structureZhu, W; Chen, TP; Yang, M; Liu, Y; Fung, S2011740
     
    Monte carlo simulation of positron induced secondary electrons in thin carbon foilsCai, LH; Yang, B; Ling, CC; Beling, CD; Fung, S2011117
     
    Positron annihilation study of defects in electron-irradiated single crystal zinc oxideTo, CK; Yang, B; Beling, CD; Fung, S; Ling, CC; Gong, M2011209
     
    Charge storage behaviors of ge nanocrystals embedded in SiO 2 for the application in non-volatile memory devicesYang, M; Chen, TP; Wong, JI; Liu, Y; Tseng, AA; Fung, S2010159
     
    Evolution of electroluminescence from multiple Si-implanted silicon nitride films with thermal annealingCen, ZH; Chen, TP; Ding, L; Liu, Y; Wong, JI; Yang, M; Liu, Z; Goh, WP; Zhu, FR; Fung, S2009539
     
    Positron annihilation spectroscopic study of hydrothermal grown n-type zinc oxide single crystalHui, CW; Zhang, ZD; Zhou, TJ; Ling, CC; Beling, CD; Fung, S; Brauer, G; Anwand, W; Skorupa, W2007323
     
    Temperature dependence study of positronium formation in high density polyethylene by positron annihilation lifetime spectroscopyNahid, F; Beling, CD; Fung, S2007108
     
    Silicon and carbon vacancies in silicon carbide studied by coincidence Doppler broadening spectroscopyZhang, JD; Cheng, CC; Ling, CC; Beling, CD; Fung, S2007156
     
    Doppler broadening of annihilation radiation spectroscopy study using Richardson-Lucy, Maximum Entropy and Huber methodsYu, DP; Zhang, JD; Cheng, V; Beling, CD; Fung, S2007129
     
    Positron annihilation study of hydrothermal grown n-type zinc oxideHui, CW; Zhang, J; Zhou, T; Ling, FCC; Beling, CD; Fung, SHY; Brauer, G; Anwand, W; Skorupa, W2006166
     
    Deep level transient spectroscopic study of electron irradiated p-type 6H-SiCZhong, ZQ; Gong, M; Chen, X; Ling, FCC; Fung, SHY; Beling, CD2006233
     
    4-11 Electrical characterization of defects at the gallium nitride based homo- and hetero-junctionsChen, X; Huang, Y; Ling, FCC; Fung, SHY; Beling, CD2005230
     
    A real-time S-parameter imaging systemNaik, PS; Cheung, CK; Beling, CD; Fung, S2005179
     
    Photoluminescence of electron/neutron-irradiated n-type 6H-SiCZhong, ZQ; Wu, DX; Gong, M; Wang, O; Xu, SJ; Chen, X; Ling, FCC; Fung, SHY; Beling, CD2005184
     
    Raman scattering and X-ray diffraction study of neutron irradiated GaN epilayersWang, RX; Xu, SJ; Li, S; Fung, S; Beling, CD; Wang, K; Wei, ZF; Zhou, TJ; Zhang, JD; Gong, M; Pang, GKH2005526
     
    Deep level defects in 6H silicon carbide induced by particles irradiationsLing, FCC; Chen, X; Gong, M; Ge, WK; Wang, JN; Yang, CL; Brauer, G; Anwand, W; Skorupa, W; Beling, CD; Fung, SHY; Wang, HY; Weng, HM2005171
     
    Deep level defects E1/E2 in n-type 6H silicon carbide induced by electron radiation and He-implantationLing, CC; Chen, XD; Fung, S; Beling, CD; Brauer, G; Anwand, W; Skorupa, W; Gong, M2005591
     
    The effect of thermal annealing on the properties of indium tin oxide thin filmsWang, RX; Beling, CD; Fung, S; Djurišić, AB; Kwong, C; Li, S2005457
     
    Identities of the deep level defects E 1/E 2 in 6H silicon carbideLing, CC; Chen, XD; Gong, M; Weng, HM; Hang, DS; Beling, CD; Fung, S; Lam, TW; Lam, CH200477
     
    Optimized Coincidence Doppler Broadening Spectroscopy using deconvolution algorithmsHo, KF; Ching, HM; Cheng, KW; Beling, CD; Fung, S; Ng, KP2004106
     
    Result pages: 1

     ! 

    Close

    Please give us some feedback!