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    HKU ResearcherPage: Fung, SHY
    rp00695.jpg picture
    Professor Fung, Stevenson Hon Yuen
    • Professor
    Publication list (Conference Papers)
    Results 1-20 of 67
    Result pages: 1
    Temperature dependence of resistive switching in aluminum/anodized aluminum film structureZhu, W; Chen, TP; Yang, M; Liu, Y; Fung, S2011740
    Monte carlo simulation of positron induced secondary electrons in thin carbon foilsCai, LH; Yang, B; Ling, CC; Beling, CD; Fung, S2011117
    Positron annihilation study of defects in electron-irradiated single crystal zinc oxideTo, CK; Yang, B; Beling, CD; Fung, S; Ling, CC; Gong, M2011209
    Charge storage behaviors of ge nanocrystals embedded in SiO 2 for the application in non-volatile memory devicesYang, M; Chen, TP; Wong, JI; Liu, Y; Tseng, AA; Fung, S2010159
    Evolution of electroluminescence from multiple Si-implanted silicon nitride films with thermal annealingCen, ZH; Chen, TP; Ding, L; Liu, Y; Wong, JI; Yang, M; Liu, Z; Goh, WP; Zhu, FR; Fung, S2009539
    Positron annihilation spectroscopic study of hydrothermal grown n-type zinc oxide single crystalHui, CW; Zhang, ZD; Zhou, TJ; Ling, CC; Beling, CD; Fung, S; Brauer, G; Anwand, W; Skorupa, W2007323
    Temperature dependence study of positronium formation in high density polyethylene by positron annihilation lifetime spectroscopyNahid, F; Beling, CD; Fung, S2007108
    Silicon and carbon vacancies in silicon carbide studied by coincidence Doppler broadening spectroscopyZhang, JD; Cheng, CC; Ling, CC; Beling, CD; Fung, S2007156
    Doppler broadening of annihilation radiation spectroscopy study using Richardson-Lucy, Maximum Entropy and Huber methodsYu, DP; Zhang, JD; Cheng, V; Beling, CD; Fung, S2007129
    Positron annihilation study of hydrothermal grown n-type zinc oxideHui, CW; Zhang, J; Zhou, T; Ling, FCC; Beling, CD; Fung, SHY; Brauer, G; Anwand, W; Skorupa, W2006166
    Deep level transient spectroscopic study of electron irradiated p-type 6H-SiCZhong, ZQ; Gong, M; Chen, X; Ling, FCC; Fung, SHY; Beling, CD2006233
    4-11 Electrical characterization of defects at the gallium nitride based homo- and hetero-junctionsChen, X; Huang, Y; Ling, FCC; Fung, SHY; Beling, CD2005230
    A real-time S-parameter imaging systemNaik, PS; Cheung, CK; Beling, CD; Fung, S2005179
    Photoluminescence of electron/neutron-irradiated n-type 6H-SiCZhong, ZQ; Wu, DX; Gong, M; Wang, O; Xu, SJ; Chen, X; Ling, FCC; Fung, SHY; Beling, CD2005184
    Raman scattering and X-ray diffraction study of neutron irradiated GaN epilayersWang, RX; Xu, SJ; Li, S; Fung, S; Beling, CD; Wang, K; Wei, ZF; Zhou, TJ; Zhang, JD; Gong, M; Pang, GKH2005526
    Deep level defects in 6H silicon carbide induced by particles irradiationsLing, FCC; Chen, X; Gong, M; Ge, WK; Wang, JN; Yang, CL; Brauer, G; Anwand, W; Skorupa, W; Beling, CD; Fung, SHY; Wang, HY; Weng, HM2005171
    Deep level defects E1/E2 in n-type 6H silicon carbide induced by electron radiation and He-implantationLing, CC; Chen, XD; Fung, S; Beling, CD; Brauer, G; Anwand, W; Skorupa, W; Gong, M2005591
    The effect of thermal annealing on the properties of indium tin oxide thin filmsWang, RX; Beling, CD; Fung, S; Djurišić, AB; Kwong, C; Li, S2005457
    Identities of the deep level defects E 1/E 2 in 6H silicon carbideLing, CC; Chen, XD; Gong, M; Weng, HM; Hang, DS; Beling, CD; Fung, S; Lam, TW; Lam, CH200477
    Optimized Coincidence Doppler Broadening Spectroscopy using deconvolution algorithmsHo, KF; Ching, HM; Cheng, KW; Beling, CD; Fung, S; Ng, KP2004106
    Result pages: 1



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